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Fluorescence property and dissolution site of Er3+ in Ta2O5 film prepared by sol-gel method and dip-coating technique

Published online by Cambridge University Press:  03 March 2011

Noriyuki Wada ,
Michiyo Kubo ,
Nobuko Maeda ,
Maegawa Akira  and
Kazuo Kojima
Noriyuki Wada
Affiliation:
Department of Materials Science and Engineering, Suzuka National College of Technology, Shiroko, Suzuka, Mie 510-0294, Japan
Michiyo Kubo
Affiliation:
Department of Applied Chemistry, Faculty of Science and Engineering, Ritsumeikan University, 1-1-1 Noji-higashi, Kusatsu, Shiga 525-8577, Japan
Nobuko Maeda
Affiliation:
Department of Applied Chemistry, Faculty of Science and Engineering, Ritsumeikan University, 1-1-1 Noji-higashi, Kusatsu, Shiga 525-8577, Japan
Maegawa Akira
Affiliation:
Industrial Research Center of Shiga Prefecture, 232 Kamitoyama, Rittou, Shiga 520-3004, Japan
Kazuo Kojima
Affiliation:
Department of Applied Chemistry, Faculty of Science and Engineering, Ritsumeikan University, 1-1-1 Noji-higashi, Kusatsu, Shiga 525-8577, Japan
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Abstract

Ta2O5–xEr2O3 (TE) films were produced by a sol-gel method and a dip-coating technique with heat treatment at 600–1000 °C. Their powders were also prepared from the same sol. The Er3+ fluorescence property of the TE films containing various contents of Er3+ was measured as a function of the heat-treatment temperature. In crystallized films, the Er3+ fluorescence was observed because water-related residues (Ta–OH and H2O) and carbon-related residues (–CH3, –CH2–, –(C ⁼ O)–, and C≡C–H) were removed from the films. It is shown from infrared absorption spectroscopy that Ta–O− and Ta ⁼ O structures dissolve the Er3+ ions selectively and play a role in dispersing the Er3+. The strongest Er3+ fluorescence is observed in the TE film with 2 mol% of Er2O3 because of its highest ability to disperse the Er3+ ions.

Keywords

Sol-gelInfrared (IR) spectroscopyOptical
Type
Articles
Information
Journal of Materials Research , Volume 19 , Issue 2 , February 2004 , pp. 667 - 675
Copyright
Copyright © Materials Research Society 2004

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