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Fast diffusion and nucleation of the amorphous phase in Ni–Zr films

Published online by Cambridge University Press:  31 January 2011

P. Ehrhart ,
R. S. Averback ,
H. Hahn ,
S. Yadavalli  and
C. P. Flynn
P. Ehrhart
Affiliation:
University of Illinois–Urbana–Champaign, Urbana, Illinois 61801
R. S. Averback
Affiliation:
University of Illinois–Urbana–Champaign, Urbana, Illinois 61801
H. Hahn
Affiliation:
University of Illinois–Urbana–Champaign, Urbana, Illinois 61801
S. Yadavalli
Affiliation:
University of Illinois–Urbana–Champaign, Urbana, Illinois 61801
C. P. Flynn
Affiliation:
University of Illinois–Urbana–Champaign, Urbana, Illinois 61801
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Abstract

The nucleation of the amorphous phase by solid-state reactions has been investigated on single-crystal Zr films grown by molecular beam epitaxy and covered in situ with either polycrystalline Ni, amorphous (a-) NiZr, or single-crystalline Zr99N01 films. Interfacial reactions were investigated by backscattering analysis or secondary ion mass spectroscopy. The amorphizing reaction occurred only in the specimen with the a-NiZr over layer, although fast Ni diffusion through the single-crystalline Zr layer was observed in all three specimens. The nucleation behavior of a-NiZr is attributed to the combination of high-Ni and low-Zr mobility in crystalline Zr.

Type
Rapid Communications
Information
Journal of Materials Research , Volume 3 , Issue 6 , December 1988 , pp. 1276 - 1278
Copyright
Copyright © Materials Research Society 1988

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References

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