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Evidence for Extensive Grain Boundary Meander and Overgrowth of Substrate Grain Boundaries in High Critical Current Density ex Situ YBa2Cu3O7−x Coated Conductors

Published online by Cambridge University Press:  01 August 2005

D.M. Feldmann ,
D.C. Larbalestier ,
T. Holesinger ,
R. Feenstra ,
A.A. Gapud  and
E.D. Specht
D.M. Feldmann*
Affiliation:
Applied Superconductivity Center, University of Wisconsin–Madison, Madison, Wisconsin 53706
D.C. Larbalestier
Affiliation:
Applied Superconductivity Center, University of Wisconsin–Madison, Madison, Wisconsin 53706
T. Holesinger
Affiliation:
Los Alamos National Laboratory, Los Alamos, New Mexico 87545
R. Feenstra
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831
A.A. Gapud
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831
E.D. Specht
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831
*
a) Address all correspondence to this author. e-mail: [email protected]
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Abstract

It has been generally accepted that YBa2Cu3O7−x (YBCO) films deposited on deformation textured polycrystalline metal tapes result in YBCO grain boundary (GB) networks that essentially replicate the GBs of the underlying substrate. Here we report that for thicker YBCO films produced by a BaF2 ex situ process, this is not true. Using electron backscatter diffraction combined with ion milling, we have been able to map the evolution of the YBCO grain structure and compare it to the underlying template in several coated conductors. For thin (≤0.5 μm) YBCO films deposited on rolling-assisted biaxially textured substrates (RABiTS), the YBCO GBs nearly directly overlap the substrate GBs. For 0.7–1.4 μm YBCO films, the GBs were found to meander along the substrate GBs and along the sample normal, with displacements several times the film thickness. In very thick films (2.5–2.9 μm), the YBCO grains can completely overgrow substrate grains and GBs, resulting in a substantial disconnection of the YBCO and substrate GB networks. Similar behavior is found for BaF2 ex situ YBCO films on ion-beam-assisted deposition-type templates. The ability of the YBCO to overgrow substrate grains and GBs is believed to be due to liquid-phase mediated laminar grain growth. Although the behavior of the YBCO GB networks changes with YBCO film thickness, the samples maintained high critical current density (Jc) values of >2 MA/cm2 for films up to 1.4 μm thick, and up to0.9 MA/cm2 for 2.5–2.9-μm-thick films.

Keywords

Crystal growthSuperconductorTransmission electron microscopy (TEM)
Type
Articles
Information
Journal of Materials Research , Volume 20 , Issue 8 , August 2005 , pp. 2012 - 2020
Copyright
Copyright © Materials Research Society 2005

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