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Erratum: “Grazing incidence synchrotron x-ray diffraction method for analyzing thin films” [J. Mater. Res. 2,471 (1987)]

Published online by Cambridge University Press:  31 January 2011

G. Lim ,
W. Parrish ,
C. Ortiz ,
M. Bellotto  and
M. Hart
G. Lim
Affiliation:
IBM Almaden Research Center, San Jose, California 95120-6099
W. Parrish
Affiliation:
IBM Almaden Research Center, San Jose, California 95120-6099
C. Ortiz
Affiliation:
IBM Almaden Research Center, San Jose, California 95120-6099
M. Bellotto
Affiliation:
Università di Brescia, 25060 Brescia, Italy
M. Hart
Affiliation:
Department of Physics, The University, Manchester M13 9PL, United Kingdom

Abstract

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Type
Errata
Information
Journal of Materials Research , Volume 3 , Issue 1 , February 1988 , pp. 196
Copyright
Copyright © Materials Research Society 1988