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Electronic transport through crossed conducting polymer nanowires

Published online by Cambridge University Press:  31 January 2011

Yun-Ze Long ,
Jean-Luc Duvail ,
Qing-Tao Wang ,
Meng-Meng Li  and
Chang-Zhi Gu
Yun-Ze Long*
Affiliation:
College of Physics Science, Qingdao University, Qingdao 266071, People’s Republic of China
Jean-Luc Duvail
Affiliation:
Institut des Matériaux Jean Rouxel (IMN), Université de Nantes, 44322 Nantes, CNRS, France
Meng-Meng Li
Affiliation:
College of Physics Science, Qingdao University, Qingdao 266071, People’s Republic of China
Chang-Zhi Gu
Affiliation:
Institute of Physics, Chinese Academy of Sciences, Beijing 100190, People’s Republic of China
*
a) Address all correspondence to this author. e-mail: [email protected]
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Abstract

In order to study the electronic properties of conjugated polymer nanowire junctions, we have fabricated two devices consisting of two crossed poly(3,4-ethylenedioxythiophene) (PEDOT) nanowires with platinum microleads attached to each end of each nanowire. We find that the junction resistance of the crossed nanowires is much larger than the intrinsic resistance of the individual PEDOT nanowire, and increases with decreasing temperature, which can be described by a thermal fluctuation-induced tunneling conduction model. In addition, the crossed junctions show linear current-voltage characteristics at room temperature.

Keywords

Electrical propertiesNanoscalePolymer
Type
Articles
Information
Journal of Materials Research , Volume 24 , Issue 10 , October 2009 , pp. 3018 - 3022
Copyright
Copyright © Materials Research Society 2009

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