Hostname: page-component-586b7cd67f-rdxmf Total loading time: 0 Render date: 2024-11-26T12:42:01.789Z Has data issue: false hasContentIssue false
  • English
  • Français

Effects of heat treatment on Ag particle growth and optical properties in Ag/SiO2 glass composite thin films

Published online by Cambridge University Press:  03 March 2011

I. Tanahashi ,
M. Yoshida ,
Y. Manabe  and
T. Tohda
I. Tanahashi
Affiliation:
Central Research Laboratories, Matsushita Electric Industrial Co., Ltd., Hikaridai, Seika-cho, Kyoto 619-02, Japan
M. Yoshida
Affiliation:
Central Research Laboratories, Matsushita Electric Industrial Co., Ltd., Hikaridai, Seika-cho, Kyoto 619-02, Japan
Y. Manabe
Affiliation:
Central Research Laboratories, Matsushita Electric Industrial Co., Ltd., Hikaridai, Seika-cho, Kyoto 619-02, Japan
T. Tohda
Affiliation:
Central Research Laboratories, Matsushita Electric Industrial Co., Ltd., Hikaridai, Seika-cho, Kyoto 619-02, Japan
Get access

Abstract

Small Ag particles were embedded in SiO2 glass thin films by a multi-target sputtering method. The mean diameter of Ag particles in the as-deposited film with 28.0 at. % of Ag was estimated to be 4.4 nm and it was increased to 24.0 nm when the film was heat-treated at 700 °C for 3 h. The diameter was proportional to the cube root of the heat-treatment time, suggesting that the Ag particles grew in the supersaturated solid solution. In the optical absorption spectra of the heat-treated films, the absorption peak due to the surface plasmon resonance of Ag particles was observed about 410 nm. The peak intensity became large and the full width at half maximum of the absorption band was decreased with increasing the diameter of Ag particles.

Type
Articles
Information
Journal of Materials Research , Volume 10 , Issue 2 , February 1995 , pp. 362 - 365
Copyright
Copyright © Materials Research Society 1995

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1Ricard, D., Roussignol, P., and Flytzanis, C., Opt. Lett. 10, 511 (1985).CrossRefGoogle Scholar
2Heolweil, E. J. and Hochestrasser, R. M., J. Chem. Phys. 82, 4762 (1985).CrossRefGoogle Scholar
3Hache, F., Ricard, D., Flytzanis, C., and Kreibig, U., Appl. Phys. A 47, 347 (1988).CrossRefGoogle Scholar
4Bloemer, M. J., Haus, J. W., and Ashley, P. R., J. Opt. Soc. Am. B 7, 790 (1990).CrossRefGoogle Scholar
5Akai, T., Kadono, K., Yamanaka, H., Sakaguchi, T., Miya, M., and Wakabayashi, H., J. Ceram. Soc. Jpn. 101, 105 (1993).CrossRefGoogle Scholar
6Kreibig, U., Appl. Phys. 10, 255 (1976).CrossRefGoogle Scholar
7Tanahashi, I., Yoshida, M., Manabe, Y., Tohda, T., Sasaki, S., Tokizaki, T., and Nakamura, A., Jpn. J. Appl. Phys. 33, L1410 (1994).CrossRefGoogle Scholar
8Liu, L. C. and Risbud, S. H., J. Appl. Phys. 68, 28 (1990).CrossRefGoogle Scholar
9Ekimov, A. I., Efros, Al. L., and Onushchenko, A. A., Solid State Commun. 56, 921 (1985).CrossRefGoogle Scholar
10Fu, J., Osaka, A., Nanba, T., and Miura, Y., J. Mater. Res. 9, 493 (1994).CrossRefGoogle Scholar
11Nasu, H., Kaneko, S., Tsunetomo, K., and Kamiya, K., J. Ceram. Soc. Jpn. 99, 266 (1991).CrossRefGoogle Scholar
12Kreibig, U. and Fragstein, C. V., Z. Physik 224, 307 (1969).CrossRefGoogle Scholar