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Effect of crystallinity on the dielectric loss of sputter-deposited (Ba,Sr)TiO3 thin films in the microwave range

Published online by Cambridge University Press:  31 January 2011

Tae-Gon Kim ,
Jeongmin Oh ,
Taeho Moon ,
Yongjo Kim ,
Byungwoo Park ,
Young-Taek Lee  and
Sangwook Nam
Tae-Gon Kim
Affiliation:
School of Materials Science and Engineering, Seoul National University, Seoul 151–744, Korea
Jeongmin Oh
Affiliation:
School of Materials Science and Engineering, Seoul National University, Seoul 151–744, Korea
Taeho Moon
Affiliation:
School of Materials Science and Engineering, Seoul National University, Seoul 151–744, Korea
Yongjo Kim
Affiliation:
School of Materials Science and Engineering, Seoul National University, Seoul 151–744, Korea
Byungwoo Park*
Affiliation:
School of Materials Science and Engineering, Seoul National University, Seoul 151–744, Korea
Young-Taek Lee
Affiliation:
School of Electrical Engineering and Computer Science, Seoul National University, Seoul 151–744, Korea
Sangwook Nam
Affiliation:
School of Electrical Engineering and Computer Science, Seoul National University, Seoul 151–744, Korea
*
a)Address all correspondence to this author. e-mail: [email protected]
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Abstract

The crystallinity dependence of the microwave dielectric losses in (Ba,Sr)TiO3 thin films was investigated. The sputter-deposition temperatures were altered to vary the level of thin-film crystallinity on a Pt/Si substrate. The dielectric losses (tan δ) were measured up to 6 GHz without parasitic (stray) effects by using a circular-patch capacitor geometry and an equivalent-circuit model. The microwave dielectric losses increased from 0.0024 ± 0.0018 to 0.0102 ± 0.0017 with increasing crystallinity. These deteriorated dielectric losses showed a good correlation with the symmetry-breaking defects, as confirmed by Raman spectra at approximately 760 cm−1, inducing microscopic polar regions above the Curie temperature of the bulk (Ba0.43Sr0.57)TiO3.

Type
Articles
Information
Journal of Materials Research , Volume 18 , Issue 3 , March 2003 , pp. 682 - 686
Copyright
Copyright © Materials Research Society 2003

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