Hostname: page-component-586b7cd67f-gb8f7 Total loading time: 0 Render date: 2024-11-22T22:19:11.329Z Has data issue: false hasContentIssue false

Effect of annealing on fluorescence of Ce3+-doped silica prepared by sol-gel process

Published online by Cambridge University Press:  31 January 2011

H. J. Bi
Affiliation:
Institute of Solid State Physics, Chinese Academy of Sciences, P.O. Box 1129, Hefei 230031, People's Republic of China
W. P. Cai
Affiliation:
Institute of Solid State Physics, Chinese Academy of Sciences, P.O. Box 1129, Hefei 230031, People's Republic of China
H. Z. Shi
Affiliation:
Institute of Solid State Physics, Chinese Academy of Sciences, P.O. Box 1129, Hefei 230031, People's Republic of China
L. D. Zhang
Affiliation:
Institute of Solid State Physics, Chinese Academy of Sciences, P.O. Box 1129, Hefei 230031, People's Republic of China
B. D. Yao
Affiliation:
Institute of Solid State Physics, Chinese Academy of Sciences, P.O. Box 1129, Hefei 230031, People's Republic of China
Get access

Abstract

We prepared Ce3+-doped silica by the sol-gel method and studied the effect of annealing on fluorescence of these samples. Different fluorescence was observed for samples annealed at different temperatures, changing gradually from solution like fluorescence to fluorescence similar to that observed in the Ce3+-doped silica prepared by chemical vapor deposition. It was found that the emission intensity first decreased with increasing annealing temperature until 500 °C, and then increased with the temperature ranging from 500 to 950 °C. Meanwhile, the emission peak showed a large red shift and an obvious broadening. These changes were attributed to the annealing-induced structural evolution in silica: Ce3+ ions changed from coordinating with water and terminal OH-groups to embedding in silica network.

Type
Articles
Copyright
Copyright © Materials Research Society 2000

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1.Lochhead, M.J. and Bray, K.L., J. Non-Cryst. Solids 170, 43 (1994).CrossRefGoogle Scholar
2.Arai, K., Namikawa, H., Kumata, K., Honda, T., Ishii, Y., and Handa, T., J. App. Phys. 59, 3430 (1986).CrossRefGoogle Scholar
3.Zhou, Y., Lam, Y.L., Wang, S.S., Liu, H.L., Kam, C.H., and Chan, Y.C., Appl. Phys. Lett. 71, 587 (1997).CrossRefGoogle Scholar
4.Qian, G., Wang, M-Q., Wang, M., Fan, X., and Hong, Z., J. Lumin. 75, 63 (1997).Google Scholar
5.Stein, G., Wurzberg, E., J. Chem. Phys. 62, 208 (1975).CrossRefGoogle Scholar
6.Levy, D., Reisffld, R., and Avnir, D., Chem. Phys. Lett. 109, 593 (1984).CrossRefGoogle Scholar
7.Nogues, J-L.R and Moreshead, W.V., J. Non-Cryst. Solids 121, 136 (1990).CrossRefGoogle Scholar
8.Blasse, G. and Bril, A., J. Chem. Phys. 47, 5139 (1967).CrossRefGoogle Scholar
9.Hong, H. and Li, Y., Luminescence and Display Devices 5, 2 (1984) (in Chinese).Google Scholar
10.Murakta, T., Sato, S., Ohgawara, T., and Suzuki, T., J. Mater. Sci. 27, 1567 (1992).CrossRefGoogle Scholar
11.Campostrini, R., Carturan, M., Ferrari, M., Montagna, M., and Pilla, O., J. Mater. Res. 7, 745 (1992).CrossRefGoogle Scholar
12.Arai, K., Namikawa, H., Ishii, Y., Imai, H., Hosono, H., and Abe, Y., J. Non-Cryst. Solids 95&96, 609 (1987).CrossRefGoogle Scholar
13.Ishii, Y., Arai, K., Namikawa, H., Tanaka, M., Negishi, A., and Handa, T., J. Am. Ceram. Soc. 70, 72 (1987).CrossRefGoogle Scholar
14.Yamane, M. and Kojima, T., J. Non-Cryst. Solids 44, 181 (1981).CrossRefGoogle Scholar
15.Bi, H., Cai, W., and Zhang, L., Mater. Res. Bull. 35, (2000, in press).CrossRefGoogle Scholar
16.Van Uitert, L.G., J. Electrochem. Soc.: Solid State Sci 114, 1048 (1967).CrossRefGoogle Scholar
17.Van Uitert, L.G. and Johnson, L.F., J. Chem. Phys. 44, 3514 (1966).CrossRefGoogle Scholar
18.Xu, W., Dai, S., Toth, L.M., Del Cul, G.D., and Peterson, J.R., J. Non-Cryst. Solids 194, 235 (1996).CrossRefGoogle Scholar
19.Glinka, Y.D., Lin, S-H., and Chen, Y-T., Appl. Phys. Lett. 75, 778 (1999).CrossRefGoogle Scholar
20.Glinka, Y.D., Jaroniec, C.R., and Jaroniec, M., J. Colloid Interface Sci. 194, 210 (1998).CrossRefGoogle Scholar
21.Duffy, J.A. and Ingram, M.D., J. Non-Cryst. Solids 21, 373 (1976).CrossRefGoogle Scholar