Hostname: page-component-78c5997874-v9fdk Total loading time: 0 Render date: 2024-11-17T14:08:34.441Z Has data issue: false hasContentIssue false
  • English
  • Français

Difficulties in measuring electrical conductivities in highly insulating materials: Radiation-induced electrical degradation is an artifact

Published online by Cambridge University Press:  31 January 2011

W. Kesternich
W. Kesternich
Affiliation:
Institut für Festkörperforschung, Forschungszentrum Jülich, 52425 Jülich, Germany, and Association Euratom
Get access

Abstract

Measurement of the electrical conductivity in high-resistance insulators is made difficult by previously unrecognized limits in the electric guarding technique. Electron irradiation experiments on single-crystalline Al2O3, performed for studying the effects of irradiation on the electrical conductivity, revealed that radiation-induced electrical degradation effects in ceramic insulators, previously reported to occur after electron, ion, and neutron irradiation, are an artifact.

Type
Articles
Information
Journal of Materials Research , Volume 15 , Issue 11 , November 2000 , pp. 2280 - 2283
Copyright
Copyright © Materials Research Society 2000

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1.Hobbs, L.W., Clinard, F.W. Jr, Zinkle, S.J., and Ewing, R.C., J. Nucl. Mater. 216, 291 (1994).CrossRefGoogle Scholar
2.Zinkle, S.J. and Hodgson, E.R., J. Nucl. Mater. 191–194, 58 (1992).CrossRefGoogle Scholar
3.Kinoshita, C. and Zinkle, S.J., J. Nucl. Mater. 233–237, 100 (1996).CrossRefGoogle Scholar
4.Hodgson, E.R., Cryst. Lattice Defects Amorphous Mater. 18, 169 (1989).Google Scholar
5.Hodgson, E.R., J. Nucl. Mater. 179–181, 383 (1991).CrossRefGoogle Scholar
6.Hodgson, E.R., Radiat. Eff. Defects Solids 119–121, 827 (1991).CrossRefGoogle Scholar
7.Hodgson, E.R., Nucl. Instrum. Methods Phys. Res. B 65, 298 (1992).CrossRefGoogle Scholar
8.Hodgson, E.R., J. Nucl. Mater. 191–194, 552 (1992).CrossRefGoogle Scholar
9.Hodgson, E.R., in Defects in Insulating Materials, edited by Kanert, O. and Spaeth, J-M. (World Scientific, New York, 1993), Vol. 2, p. 332.Google Scholar
10.Pells, G.P., J. Nucl. Mater. 184, 177 (1991).CrossRefGoogle Scholar
11.Shikama, T., Narui, M., Endo, Y., Sagawa, T., and Kayano, H., J. Nucl. Mater. 191–194, 575 (1992).CrossRefGoogle Scholar
12.Kesternich, W., Scheuermann, F., and Zinkle, S.J., J. Nucl. Mater. 206, 68 (1993).CrossRefGoogle Scholar
13.Morono, A. and Hodgson, E.R., J. Nucl. Mater. 212–215, 1119 (1994).CrossRefGoogle Scholar
14.Hodgson, E.R., J. Nucl. Mater. 212–215, 1123 (1994).CrossRefGoogle Scholar
15.Jung, P., Zhu, Z., and Klein, H., J. Nucl. Mater. 206, 72 (1993).CrossRefGoogle Scholar
16.Zong, X-F., Shen, C-F., Liu, S., Wu, Z-C., Chen, Y., Evans, B.D., Gonzales, R., and Sellers, C.H., Phys. Rev. B 49, 15514 (1994).CrossRefGoogle Scholar
17.Zong, X-F., Shen, C-F., Liu, S., Wu, Z-C., Chen, Y., Zhang, R., Zhu, J.G., Chen, Y., Evans, B.D., Gonzales, R., and Sellers, C.H., J. Nucl, Mater. 219, 176 (1995).CrossRefGoogle Scholar
18.Zong, X-F., Shen, C-F., Liu, S., Chen, Y., Zhang, R., Chen, Y., Zhu, J.G., Evans, B.D., and Gonzales, R., Phys. Rev. B 54, 139 (1996).CrossRefGoogle Scholar
19.Farnum, E.H., Clinard, F.W. Jr, Sommer, W.F., Kennedy, J.C., and Shikama, T., J. Nucl. Mater. 212–215, 1128 (1994).CrossRefGoogle Scholar
20.Farnum, E.H. and Clinard, F.W. Jr, J. Nucl. Mater. 219, 161 (1995).CrossRefGoogle Scholar
21.Farnum, E.H., Shikama, T., Narui, M., Sagawa, T., and Scarborough, K., J. Nucl. Mater. 228, 117 (1996).CrossRefGoogle Scholar
22.Shikama, T., Narui, M., Kayano, H., and Sagawa, T., J. Nucl. Mater. 212–215, 1133 (1994).CrossRefGoogle Scholar
23.Pells, G.P. and Sowden, B.C., J. Nucl. Mater. 223, 174 (1995).CrossRefGoogle Scholar
24.Pells, G.P. and Hodgson, E.R., J. Nucl. Mater. 226, 286 (1995).CrossRefGoogle Scholar
25.Kesternich, W., Scheuermann, F., and Zinkle, S.J., J. Nucl. Mater. 219, 190 (1995).CrossRefGoogle Scholar
26.Scheuermann, F. and Kesternich, W., Proceedings of the Fourth International Conference on Electroceramics and Applications, Aachen, Germany, 1994, Vol. 2, p. 1119.Google Scholar
27.Kesternich, W., J. Nucl. Mater. 253, 167 (1998).CrossRefGoogle Scholar
28.Kesternich, W., J. Appl. Phys. 85, 748 (1999).CrossRefGoogle Scholar
29.Evans, B.D., J. Nucl. Mater. 219, 202 (1995).CrossRefGoogle Scholar
30.Möslang, A., Daum, E., and Lindau, R., Proceedings of the 18th Symposium of Fusion Technology, Karlsruhe, Germany, August 22–26, 1995, p. 131.Google Scholar
31.Hunn, J.D., Stoller, R.E., and Zinkle, S.J., J. Nucl. Mater. 219, 169 (1995).CrossRefGoogle Scholar
32.Zinkle, S.J., Hunn, J.D., and Stoller, R.E., in Microstructure of Irradiated Materials, edited by Robertson, I.M., Zinkle, S.J., Rehn, L.E., and Phythian, W.J. (Mater. Res. Soc. Symp. Proc. 373, Pittsburgh, PA, 1995), p. 299.Google Scholar
33.Snead, L.L., White, D.P., and Zinkle, S.J., J. Nucl. Mater. 226, 58 (1995).CrossRefGoogle Scholar
34.Patuwathavithane, C., Wu, W.Y., and Zee, R.H., J. Nucl. Mater. 225, 328 (1995).CrossRefGoogle Scholar
35.Morono, A. and Hodgson, E.R., J. Nucl. Mater. 233–237, 1299 (1996).CrossRefGoogle Scholar
36.Shiiyama, K., Izu, T., Kinosita, C., and Kutsuwada, M., J. Nucl. Mater. 233–237, 1332 (1996).CrossRefGoogle Scholar
37.Terai, T., Kobayashi, T., Yoneoka, T., and Tanaka, S., Nucl. Instrum. Methods Phys. Res. B 116, 294 (1996).CrossRefGoogle Scholar
38.Zinkle, S.J., Eatherly, W.S., Snead, L.L., Shikama, T., and Shiiyama, K., Fusion Reactor Semiannual Prog. Rep. DOE/ER-0313/22, 197, p. 188.Google Scholar
39.Möslang, A., IEA Workshop on Radiation Effects in Ceramic Insulators, Cincinnati, OH, (1997) Proc., edited by Zinkle, S.J., Hodgson, E.R., and Shikama, T., Report ORNL/M-6068 (Oak Ridge National Laboratory, Oak Ridge, TN).Google Scholar
40.Howlader, M.M.R, Kinoshita, C., Izu, T., Shiiyama, K., and Kutsuwada, M., J. Nucl. Mater. 239, 245 (1996).CrossRefGoogle Scholar
41.White, D.P., Snead, L.L., Zinkle, S.J., and Eatherly, W.S., J. Appl. Phys. 93, 1924 (1998).CrossRefGoogle Scholar
42.Tanufuji, T., Katano, Y., Nakazawa, T., and Noda, K., J. Nucl. Mater. 253, 156 (1998).CrossRefGoogle Scholar
43.Ninth IEA Workshop on Radiation Effects in Ceramic Insulators, Cincinnati, OH (1997) Proc., edited by Zinkle, S.J., Hodgson, E.R., and Shikama, T., Report ORNL/M-6068 (Oak Ridge National Laboratory, Oak Ridge, TN).Google Scholar
44. ASTM Standard Test Methods for DC Resistance or Conductance of Insulating Materials, D-257–91 (American Society for Testing and Materials, Philadelphia, PA 1991).Google Scholar
45.Will, F.G. and Janora, K.H., J. Am. Ceram. Soc. 75, 2795 (1992).CrossRefGoogle Scholar
46.Chen, Yok (private communication).Google Scholar