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Determination of structure-property relationships for 3-aminopropyltriethoxysilane films using x-ray reflectivity

Published online by Cambridge University Press:  03 April 2013

Sandip U. Argekar ,
Terence L. Kirley  and
Dale W. Schaefer
Sandip U. Argekar
Affiliation:
Chemical and Materials Engineering Programs, School of Energy, Environmental, Biological and Medical Engineering, University of Cincinnati, Cincinnati, Ohio 45221-0012
Terence L. Kirley
Affiliation:
Department of Pharmacology and Cell Biophysics, University of Cincinnati, Cincinnati, Ohio 45267-0575
Dale W. Schaefer*
Affiliation:
School of Energy, Environmental, Biological and Medical Engineering, University of Cincinnati, Cincinnati, Ohio 45221-0012
*
a)Address all correspondence to this author. e-mail: [email protected]
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Abstract

Films of 3-aminopropyltriethoxysilane films (APTES) deposited from nonpolar solvents show unusual hardness and tribological properties. The morphological origin of this behavior is determined using x-ray reflectivity. The deposited APTES films are smooth, evolving from a sparse structure when less than two-molecule-thick (<1 g/cm3) to a dense structure (1.26 g/cm3) when thicker. Previously reported improvements in wear resistance and hardness are due to the unusually dense nature of the APTES film. The density of multilayered APTES film has implications for its use as an interface-coupling agent because the film density limits the reactivity of embedded amine groups. A high-temperature cure (120 °C) does not affect film density but does significantly improve hydrolytic stability. Given their high density, predictable reactivity, stability and resistance to wear, multilayered APTES films are well suited for interfacial modification designed to improve mechanical properties, provided the films are properly cured.

Type
Articles
Information
Journal of Materials Research , Volume 28 , Issue 8 , 28 April 2013 , pp. 1118 - 1128
Copyright
Copyright © Materials Research Society 2013

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