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Detection of a metallic glass layer by x-ray diffraction

Published online by Cambridge University Press:  31 January 2011

J.W. McCamy ,
M.J. Godbole ,
A.J. Pedraza  and
D.H. Lowndes
J.W. McCamy
Affiliation:
Department of Materials Science and Engineering, The University of Tennessee, Knoxville, Tennessee 37996-2200
M.J. Godbole
Affiliation:
Department of Materials Science and Engineering, The University of Tennessee, Knoxville, Tennessee 37996-2200
A.J. Pedraza
Affiliation:
Department of Materials Science and Engineering, The University of Tennessee, Knoxville, Tennessee 37996-2200
D.H. Lowndes
Affiliation:
Solid State Division. Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831
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Abstract

A simple, precise method for obtaining the average thickness of an amorphous layer formed by any surface treatment has been developed. The technique uses an x-ray diffractoeter to measure the reduction in the integrated intensity of several diffracted x-ray lines due to the near surface amorphous layer. The target material for generation of x rays is selected so that the emitted x rays are strongly absorbed by the specimen. This method permits thickness measurements down to ∼ 100 nm. It has been tested on a specimen of Fe80B20 on which an amorphous layer was produced by pulsed XeCl (308 nm) laser irradiation; the amorphous layer thickness was found to be 1.34 (∼0.1) um.

Type
Articles
Information
Journal of Materials Research , Volume 1 , Issue 5 , October 1986 , pp. 629 - 634
Copyright
Copyright © Materials Research Society 1986

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References

REFERENCES

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