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Comparison of convergent beam electron diffraction and annular bright field atomic imaging for GaN polarity determination

Published online by Cambridge University Press:  13 December 2016

Alexana Roshko ,
Matt D. Brubaker ,
Paul T. Blanchard ,
Kris A. Bertness ,
Todd E. Harvey ,
Roy H. Geiss  and
Igor Levin
Alexana Roshko*
Affiliation:
Applied Physics Division, NIST, Boulder, CO 80305
Matt D. Brubaker
Affiliation:
Applied Physics Division, NIST, Boulder, CO 80305
Paul T. Blanchard
Affiliation:
Applied Physics Division, NIST, Boulder, CO 80305
Kris A. Bertness
Affiliation:
Applied Physics Division, NIST, Boulder, CO 80305
Todd E. Harvey
Affiliation:
Applied Physics Division, NIST, Boulder, CO 80305
Roy H. Geiss
Affiliation:
Department of Chemistry, Colorado State University, Fort Collins, CO 80523
Igor Levin
Affiliation:
Materials Measurement Science Division, NIST, Gaithersburg, MD 20899
*
a)Address all correspondence to this author. e-mail: [email protected]
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Abstract

A comparison of two electron microscopy techniques used to determine the polarity of GaN nanowires is presented. The techniques are convergent beam electron diffraction (CBED) in TEM mode and annular bright field (ABF) imaging in aberration corrected STEM mode. Both measurements were made at nominally the same locations on a variety of GaN nanowires. In all cases the two techniques gave the same polarity result. An important aspect of the study was the calibration of the CBED pattern rotation relative to the TEM image. Three different microscopes were used for CBED measurements. For all three instruments there was a substantial rotation of the diffraction pattern (120 or 180°) relative to the image, which, if unaccounted for, would have resulted in incorrect polarity determination. The study also shows that structural defects such as inversion domains can be readily identified by ABF imaging, but may escape identification by CBED. The relative advantages of the two techniques are discussed.

Keywords

scanning transmission electron microscopytransmission electron microscopycrystallographic structure
Type
Articles
Information
Journal of Materials Research , Volume 32 , Issue 5: Focus Issue: Aberration Corrected Transmission Electron Microscopy , 14 March 2017 , pp. 936 - 946
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Copyright
Copyright © Materials Research Society 2016 

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Footnotes

Contributing Editor: Thomas Walther

References

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