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Chemical bonding characteristics and dielectric properties of Nd2(Ba1−xSrx)ZnO5 solid solutions

Published online by Cambridge University Press:  03 March 2011

Akinori Kan ,
Hirotaka Ogawa ,
Kenkichi Mori ,
Hitoshi Ohsato  and
Yoshinori Andou
Akinori Kan*
Affiliation:
Faculty of Science and Technology, Meijo University, 1–501 Shiogamaguchi, Tempaku-ku, Nagoya 468–8502, Japan
Hirotaka Ogawa
Affiliation:
Faculty of Science and Technology, Meijo University, 1–501 Shiogamaguchi, Tempaku-ku, Nagoya 468–8502, Japan
Kenkichi Mori
Affiliation:
Faculty of Science and Technology, Meijo University, 1–501 Shiogamaguchi, Tempaku-ku, Nagoya 468–8502, Japan
Hitoshi Ohsato
Affiliation:
Department of Materials Science and Engineering, Nagoya Institute of Technology, Gokiso-cho, Showa-ku, Nagoya 466–8555, Japan
Yoshinori Andou
Affiliation:
Faculty of Science and Technology, Meijo University, 1–501 Shiogamaguchi, Tempaku-ku, Nagoya 468–8502, Japan
*
a)Address all correspondence to this author.
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Abstract

The relationship between the microwave dielectric property and crystal structure of Nd2(Ba1−xSrx)ZnO5 solid solutions was investigated using bond valence theorem and first principle method (DV-Xα method). The evaluation of the covalence characteristics of cation–oxygen bonds revealed that as the x value increased, the covalence characteristics of the M–O (M = Ba and Sr) bonds in the MO10 polyhedron decreased while those of the Zn–O(2) bonds in the ZnO4 tetrahedron increased. From the DV-Xα method, it was found that the 3d electrons of the Zn2+ ion are closely related to the strong covalence characteristics of the Zn–O(2) bonds. The dielectric constants were approximately constant over the whole composition; this result is considered to relate to the decrease in the covalence characteristic of the M–O bonds. The quality factors increased from 4915 to 25,836 GHz, and the grain growth of the solid solutions are considered to improve the Q × f values.

Type
Articles
Information
Journal of Materials Research , Volume 18 , Issue 10 , October 2003 , pp. 2427 - 2434
Copyright
Copyright © Materials Research Society 2003

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