Hostname: page-component-78c5997874-lj6df Total loading time: 0 Render date: 2024-11-20T01:17:37.106Z Has data issue: false hasContentIssue false
  • English
  • Français

Bulk YBa2Cu3Ox superconductors through pressurized partial melt growth processing

Published online by Cambridge University Press:  31 January 2011

S. Hu ,
H. Hojaji ,
A. Barkatt ,
M. Boroomand ,
M. Hung ,
A.C. Buechele ,
A.N. Thorpe ,
D.D. Davis  and
S. Alterescu
S. Hu
Affiliation:
The Catholic University of America, Washington, DC 20064
H. Hojaji
Affiliation:
The Catholic University of America, Washington, DC 20064
A. Barkatt
Affiliation:
The Catholic University of America, Washington, DC 20064
M. Boroomand
Affiliation:
The Catholic University of America, Washington, DC 20064
M. Hung
Affiliation:
The Catholic University of America, Washington, DC 20064
A.C. Buechele
Affiliation:
The Catholic University of America, Washington, DC 20064
A.N. Thorpe
Affiliation:
Howard University, Washington, DC 20059
D.D. Davis
Affiliation:
Howard University, Washington, DC 20059
S. Alterescu
Affiliation:
NASA Goddard Space Flight Center, Greenbelt, Maryland 20770
Get access

Abstract

We have developed a novel pressurized partial melt growth process for producing large pieces of bulk Y–Ba–Cu–O superconductors. During long-time partial melt growth stage, an additional driving force for solidification is obtained by using pressurized oxygen gas. The microstructure and superconducting properties of the resulting samples were investigated. It was found that this new technique can eliminate porosity and inhomogeneity, promote large-scale grain-texturing, and improve interdomain coupling as well.

Type
Articles
Information
Journal of Materials Research , Volume 7 , Issue 4 , April 1992 , pp. 808 - 812
Copyright
Copyright © Materials Research Society 1992

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1.Shehata, L.N., J. Low Temp. Phys. 78, 25 (1990).Google Scholar
2.Hu, S., in Ph.D. Dissertation (M.C.U., B. & H. Info. Company, Ann Arbor, MI, 1991), p. 40.Google Scholar
3.Cava, R.J., Batlogg, B., Dover, R. B. van, Murphy, D. W., Sunshine, S.,Siegrist, T., Remeika, J. P., Rietman, E. A., Zahurak, S., and Espinosa, G.P., Phys. Rev. Lett. 58, 1676 (1987).CrossRefGoogle Scholar
4.Zuo, F., Patton, B.R., Noh, T.W., Lee, S.I., Song, Y., Golben, J.P., Chen, X.D., Lee, S.Y., Gaines, J.R., Garland, J. C., and Epstein, A.J., Solid State Commun. 64, 83 (1987).CrossRefGoogle Scholar
5.Laibowitz, R. B., Koch, R. H., Chaudhari, P., and Gambino, R.J., Phys. Rev. B 35, 8821 (1987).Google Scholar
6.Mankiewich, P.M., Scofield, J. H., Skocpol, W.J., Howard, R.E., and Good, E., Appl. Phys. Lett. 51, 1753 (1987).Google Scholar
7.Crabtree, G.W., Liu, J. Z., Umezawa, A., Kwok, W. K., Sowers, C. H., Malik, S. K., Veal, B.W., Lam, D.J., Brodsky, M. B., and Downey, J.W., Phys. Rev. B 36, 4021 (1987).CrossRefGoogle Scholar
8.Schneemeyer, L. F., Gyorgy, E. M., and Waszczak, J. V., Phys. Rev. B 36, 8804 (1987).CrossRefGoogle Scholar
9.Dover, R. B. van, Gyorgy, E. M., Schneemeyer, L. F., Mitchell, J. W., Rao, K. V., Puzniak, R., and Waszczak, J. V.,Nature 342, 55 (1989).CrossRefGoogle Scholar
10.Ekin, J.W., Braginski, A.I., Panson, A.J., Janocko, M.A., Capone, D.W., II, Zaluzec, N. J., Flandermeyer, B., Lima, O. F. de, Hong, M., Kwo, J., and Liou, S. H., J. Appl. Phys. 62, 4821 (1987).CrossRefGoogle Scholar
11.Dimos, D., Chaudhari, P., and Mannhart, J.,Phys. Rev. B 41, 4038 (1990).Google Scholar
12.Babcock, S. E. and Larbalestier, D. C., J. Mater. Res. 5, 919 (1990).Google Scholar
13.Jin, S., Tiefel, T. H., Sherwood, R. C., Dowis, M. E., Dover, R. B. van, Kammlott, G.W., Fastnacht, R. A., and Keith, H. D., Appl. Phys. Lett. 52, 2074 (1988).CrossRefGoogle Scholar
14.Salama, K., Selvamanickam, V., Gao, L., and Sun, K., Appl. Phys. Lett. 54, 2352 (1989).Google Scholar
15.Murakami, M., Morita, M., and Oyama, N., Jpn. J. Appl. Phys. 28, LI 125 (1989).Google Scholar
16.Murakami, M., Mod. Phys. Lett. B 4, 163 (1990).Google Scholar
17.Hu, S., Hojaji, H., Barkatt, A., Boroomand, M., and Thorpe, A. N., Phys. Rev. B 43, 2878 (1991).CrossRefGoogle Scholar
18.Nevriva, M., Pollert, E., Sestak, J., Matejkova, L., and Triska, A., Physica C 153–155, 377 (1988).CrossRefGoogle Scholar
19.Ullman, J. E., McCallum, R.W., and Verhoeven, J. D., J. Mater. Res. 4, 752 (1989).CrossRefGoogle Scholar
20.Karpinski, J., Conder, K., and Kaldis, E., Physica C 153–155, 401 (1988).Google Scholar
21.Gyorgy, E. M., Dover, R. B. van, Jackson, K. A., Schneemeyer, L. F., and Wazczak, J. V., Appl. Phys. Lett. 55, 283 (1989).CrossRefGoogle Scholar