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Beam-induced atomic migration at Ag-containing nanofacets at an asymmetric Cu grain boundary

Published online by Cambridge University Press:  14 November 2016

Nicolas J. Peter ,
Christian H. Liebscher ,
Christoph Kirchlechner  and
Gerhard Dehm
Nicolas J. Peter
Affiliation:
Max Planck Institut für Eisenforschung GmbH, Düsseldorf 40237, Germany
Christian H. Liebscher
Affiliation:
Max Planck Institut für Eisenforschung GmbH, Düsseldorf 40237, Germany
Christoph Kirchlechner
Affiliation:
Max Planck Institut für Eisenforschung GmbH, Düsseldorf 40237, Germany
Gerhard Dehm*
Affiliation:
Max Planck Institut für Eisenforschung GmbH, Düsseldorf 40237, Germany
*
a)Address all correspondence to this author. e-mail: [email protected]
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Abstract

Besides the high spatial resolution achieved in aberration-corrected scanning transmission microscopy, beam-induced dynamic effects have to be considered for quantitative chemical characterization on the level of single atomic columns. The present study investigates the influence of imaging conditions in an aberration-corrected scanning transmission electron microscope on the beam-induced atomic migration at a complex Ag-segregated, nanofaceted Cu grain boundary. Three distinct imaging conditions including static single image and serial image acquisition have been utilized. Chemical information on the Ag column occupation of single atomic columns at the grain boundary was extracted by the evolution of peak intensity ratios and compared to idealized scanning transmission electron microscopy image simulations. The atomic column occupation is underestimated when using conventional single frame acquisition due to an averaging of Ag atomic migration events during acquisition. Possible migration paths for the beam-induced atomic motion at a complex Cu grain boundary are presented.

Keywords

scanning transmission electron microscopyelectron irradiationnanoscale
Type
Articles
Information
Journal of Materials Research , Volume 32 , Issue 5: Focus Issue: Aberration Corrected Transmission Electron Microscopy , 14 March 2017 , pp. 968 - 982
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Copyright
Copyright © Materials Research Society 2016 

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Footnotes

Contributing Editor: Rafal E. Dunin-Borkowski

References

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