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Zinc environment in aluminoborosilicate glasses by Zn K-edge extended x-ray absorption fine structure spectroscopy

Published online by Cambridge University Press:  31 January 2011

M. Le Grand ,
A. Y. Ramos ,
G. Calas ,
L. Galoisy ,
D. Ghaleb  and
F. Pacaud
M. Le Grand
Affiliation:
Commissariat à l'Energie Atomique, Marcoule, Rhône Valley Research Center, Commissariat à l'Energie Atomique, Marcoule, 30207 Bagnols/Céze Cedex, France and Laboratorie de Minéralogie et de Cristallographie, Université; Paris VI et VII, CNRS-UMR7590, 75252 Paris Cedex, France
A. Y. Ramos
Affiliation:
Laboratoire de Minéralogie et de Cristallographie, Université Paris VI et VII, CNRS-UMR7590, 75252 Paris Cedex, France and Laboratorio Nacional de Luz Sincrotron, CP 6192, 13083–970 Campinas, Brazil
G. Calas
Affiliation:
Laboratorie de Minéralogie et de Cristallographie, UniversitéParis VI et VII, CNRS-UMR7590, 75252 Paris Cedex, France
L. Galoisy
Affiliation:
Laboratorie de Minéralogie et de Cristallographie, UniversitéParis VI et VII, CNRS-UMR7590, 75252 Paris Cedex, France
D. Ghaleb
Affiliation:
Commissariat à l'Energie Atomique, Marcoule, Rhône Valley Research Center, Commissariat à l's Energie Atomique, Marcoule, 30207 Bagnols/Céze Cedex, France
F. Pacaud
Affiliation:
Commissariat à l'Energie Atomique, Marcoule, Rhône Valley Research Center, Commissariat à l's Energie Atomique, Marcoule, 30207 Bagnols/Céze Cedex, France
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Abstract

The structural surrounding of Zn in inactive nuclear glasses was determined using extended x-ray absorption fine structure spectroscopy. Zn was found in tetrahedralcoordination ([4]Zn) with [4]Zn–O distances of 1.95 Å. ZnO4 tetrahedra shared corners with SiO4 tetrahedra [d(Zn–Si) around 3.20 Å]. The oxygens of the Zn–O–Si bonds were charge compensated by Na+ and, to a minor extent, by Cs+. The influence of [4]Zn on the formation of charge-compensating cations at the expense of network modifiers may explain the stabilizing effect of Zn in these glasses.

Type
Articles
Information
Journal of Materials Research , Volume 15 , Issue 9 , September 2000 , pp. 2015 - 2019
Copyright
Copyright © Materials Research Society 2000

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