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Theory of capacitive probe method for noncontact characterization of dielectric properties of materials

Published online by Cambridge University Press:  08 February 2011

V.K. Tewary ,
P.R. Heyliger  and
A.V. Clark
V.K. Tewary*
Affiliation:
Materials Reliability Division, National Institute of Standards and Technology, Boulder, Colorado 80303
P.R. Heyliger*
Affiliation:
Materials Reliability Division, National Institute of Standards and Technology, Boulder, Colorado 80303
A.V. Clark
Affiliation:
Materials Reliability Division, National Institute of Standards and Technology, Boulder, Colorado 80303
*
a)On attachment from The Ohio State University, Columbus, Ohio 43210.
b)Current address: Department of Civil Engineering, The Colorado State University, Fort Collins, Colorado 80523.
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Abstract

The capacitive probe method for noncontact characterization and monitoring of dielectric materials is analyzed theoretically. An analytical method based upon the Hilbert transform technique and a numerical method using the finite element technique for calculating the potential distribution and change in admittance of the probe caused by presence of the dielectric material as a function of liftoff (distance between the probe plane and the surface of the dielectric material) are described. The two methods are compared with each other and their relative advantages discussed. The possibility of extracting useful information about the dielectric constant of the material from experimental data is also discussed in the light of the proposed theory.

Type
Articles
Information
Journal of Materials Research , Volume 6 , Issue 3 , March 1991 , pp. 629 - 638
Copyright
Copyright © Materials Research Society 1991

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References

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