Hostname: page-component-586b7cd67f-l7hp2 Total loading time: 0 Render date: 2024-11-23T11:00:55.588Z Has data issue: false hasContentIssue false
  • English
  • Français

TEM studies of microstructure and composition of low-firing lead-magnesium-niobate ceramics

Published online by Cambridge University Press:  29 June 2016

S. Yegnasubramanian  and
H. C. Ling
S. Yegnasubramanian
Affiliation:
AT&T Bell Laboratories, Princeton, New Jersey 08540
H. C. Ling
Affiliation:
AT&T Bell Laboratories, Princeton, New Jersey 08540
Get access

Abstract

Ceramic dielectrics in the PbO–MgO–Nb2O5 based system, doped with several dopants such as Ti, Co, and Zn, were characterized for their microstructure and composition by transmission electron microscopy (TEM) and energy dispersive x-ray microanalysis (EDS). The ceramics exhibited a microstructure comprised of the matrix and many crystalline inclusions. The inclusions are compositionally enriched with magnesium and a smaller concentration of cobalt. Based on the selected area electron diffraction pattern (SADP) of the inclusion, the calculated interplanar spacings match those of (Mg, Co)O while those of the matrix match those of Pb(Mg0.33Nb0.67)O3. X-ray spectrometry (EDS) does not reveal a PbO phase in the matrix grain boundaries. The matrix exhibits finer features upon prolonged irradiation by the 200 keV electron beam. This does not affect the composition or interplanar spacings even though they exhibit polycrystalline diffraction patterns, and the high resolution micrographs show moiré patterns.

Type
Articles
Information
Journal of Materials Research , Volume 7 , Issue 1 , January 1992 , pp. 197 - 202
Copyright
Copyright © Materials Research Society 1992

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1.Mehino, K., Nomura, S., Cross, L.E., Jang, S.J., and Newnham, R.E., J. Appl. Phys. 5 (2), 1142–1145 (1980).Google Scholar
2.Lejeune, M. and Biolot, J.P., Am. Ceram. Soc. Bull. 65 (4), 679–682 (1986).Google Scholar
3.Swartz, S.L., Shrout, T.R., Schulze, W.A., and Cross, L.E., J. Am. Ceram. Soc. 67, 312–315 (1984).Google Scholar
4.Guha, J.P. and Anderson, H.U., J. Am. Ceram. Soc. 69 (11), C287–288 (1986).Google Scholar
5.Yan, M.F., Ling, H.C., and Rhodes, W.W., J. Mater. Res. 4, 930–944 (1989).Google Scholar
6.Ling, H.C., Rhodes, W.W., and Yan, M.F., “Method of Preparing a Ceramic Composition,” U.S. Patent 4 637 989, 01 20, 1987.Google Scholar
7.Yan, M.F., Ling, H.C., and Rhodes, W.W., J. Mater. Res. 4, 945–966 (1989).Google Scholar
8.Ling, H.C., Jackson, A.M., Yan, M.F., and Rhodes, W.W., J. Mater. Res. 5, 629–639 (1990).Google Scholar
9.Chen, Jie, Chan, H.M., and Harmer, M.P., J. Am. Ceram. Soc. 72, 593–598 (1989).Google Scholar
10.Papet, Philippe, Dougherty, Joseph P., and Shrout, Thomas R., J. Mater. Res. 5, 2902–2909 (1990).Google Scholar
11.Goo, E.K.W., Mishra, R.K., and Thomas, Gareth, J. Am. Ceram. Soc. 64, 517–519 (1981).Google Scholar
12.Goo, E., Yamamoto, T., and Okazaki, K., J. Am. Ceram. Soc. 69 (8), C188–190 (1986).Google Scholar
13.Hu, Y.H., Chan, H.M., Wen, Z.X., and Harmer, M.P., J. Am. Ceram. Soc. 69 (8), 594–602 (1986).Google Scholar
14.Nomura, S., Endo, M., and Kojima, F., Jpn. J. Appl. Phys. 13, 2004–2008 (1974).Google Scholar
15.Guha, J.P. and Anderson, H.U., J. Am. Ceram. Soc. 70, C39–C40 (1987).Google Scholar
16.Chen, Jie, Gorton, A., Chan, H.M., and Harmer, M.P., J. Am. Ceram. Soc. 69, C303 (1986).Google Scholar
17.Yegnasubramanian, S. and Ling, H.C., Proc. Xlhh Int. Congress on Electron Microscopy, Seattle, WA, 46, 222–223 (1990).Google Scholar
18.Romig, A. Jr. and Williams, D.B., Introduction to Transmission and Analytical Electron Microscopy, Mater. Res. Soc, Short Course Handbook, 1986, ATEM Pt. 4, p. 118.Google Scholar