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Surface oxidation of a quasicrystalline Al–Cu–Fe alloy:No effect of surface orientation and grain boundaries onthe final state

Published online by Cambridge University Press:  31 January 2011

P. J. Pinhero
Affiliation:
Iowa State University, Ames, Iowa 50011
J. W. Anderegg
Affiliation:
Ames Laboratory, Iowa State University, Ames, Iowa 50011
D. J. Sordelet
Affiliation:
Ames Laboratory, Department of Materials Science and Engineering, and Department of Mechanical Engineering, Iowa State University, Ames, Iowa 50011
T. A. Lograsso
Affiliation:
Ames Laboratory and Department of Materials Science and Engineering, Iowa State University, Ames, Iowa 50011
D. W. Delaney
Affiliation:
Iowa State University, Ames, Iowa 50011
P. A. Thiel*
Affiliation:
Ames Laboratory and Department of Chemistry, Iowa State University, Ames, Iowa 50011
*
c) Address all correspondence to this author.thiel@ameslab. Gov
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Abstract

We have used x-ray photoelectron spectroscopy and Auger electron spectroscopy to examine the characteristics of oxides on two types of quasicrystalline Al–Cu–Fe samples. One type was formed by consolidation of powders, resulting in multiple grains with random surface orientations. The other was a single grain, oriented to expose a fivefold surface. Both were oxidized to saturation in a variety of environments at room temperature. We measured the elemental constituents that oxidized, the extent of oxygen-induced Al segregation, and the depth of the oxide. Under the conditions of our experiments, there was little, if any, significant difference between the two types of samples. Hence, surface orientation and bulk microstructure played little or no role on the final state of the oxide under these conditions.

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Articles
Copyright
Copyright © Materials Research Society 1999

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References

REFERENCES

1.Shechtman, D., Blech, I., Gratias, D., and Cahn, J.W., Phys. Rev. Lett. 53, 1951 (1984).CrossRefGoogle Scholar
2.Shechtman, D. and Blech, I., Metall. Trans. A 16, 1005 (1985).CrossRefGoogle Scholar
3.Stephens, P.W. and Goldman, A.I., Sci. Am. 264, 2431 (1991).CrossRefGoogle Scholar
4.Goldman, A.I. and Widom, M., Annu. Rev. Phys. Chem. 42, 685729 (1991).CrossRefGoogle Scholar
5.Goldman, A.I. and Kelton, K.F., Rev. Modern Phys. 65, 213230 (1993).CrossRefGoogle Scholar
6.Janot, C., Quasicrystals: A Primer, Monographs on the Physics and Chemistry of Materials Vol. 48, edited by Hirsch, P.B., Mott, N. F., and Brook, R.J. (Clarendon Press, Oxford, U.K., 1992).CrossRefGoogle Scholar
7.Sordelet, D.J. and Dubois, J.M., MRS Bull. 22(11), 34 (1997).CrossRefGoogle Scholar
8.Dubois, J.M., in An Introduction to Structure, Physical Properties and Application of Quasicrystalline Alloys, edited by Suck, J-B., Schreiber, M., and Hausler, P. (Springer Verlag, Berlin, 1998).Google Scholar
9.Jenks, C.J. and Thiel, P.A., MRS Bull. 22(11), 55 (1997).CrossRefGoogle Scholar
10.Berger, C., Belin, E., and Mayou, D., Ann. Chim. Fr. Mater. 18, 485 (1993).Google Scholar
11.Takeuchi, S., Akiyama, H., Naito, N., Shibuya, T., Hashimoto, T., and Edagawa, K., J. Non-Cryst. Solids 153–4, 353 (1993).CrossRefGoogle Scholar
12.Dubois, J.M. and Weinland, P., European Patent No. EP 0356287 and U.S. Patent No. 5 204 191 (20 April 1993).Google Scholar
13.Dubois, J.M., Phys. Scr. T49A, 17 (1993).CrossRefGoogle Scholar
14.Dubois, J.M., Kang, S.S., and Massiani, Y., J. Non-Cryst. Solids 153–4, 443445 (1993).CrossRefGoogle Scholar
15.Kang, S.S., Dubois, J.M., and von Stebut, J., J. Mater. Res. 8, 2471 (1993).CrossRefGoogle Scholar
16.Dubois, J.M., Proner, A., Bucaille, B., Cathonnet, P., Dong, C., Richard, V., Pianelli, A., Massiani, Y., Ait-Yaazza, S., and Belin-Ferré, E., Ann. Chim. Fr. 19, 325 (1994).Google Scholar
17.Dubois, J.M., Kang, S. S., and Perrot, A., Mater. Sci. Eng. A179/A180, 122126 (1994).CrossRefGoogle Scholar
18.Viano, A.M., Stroud, R.M., Gibbons, P.C., McDowell, A.F., Conradi, M.S., and Kelton, K.F., Phys. Rev. B 51, 1202612029 (1995).CrossRefGoogle Scholar
19.Stroud, R.M., Misture, S.T., Viano, A.M., Gibbons, P.C., and Kelton, K.F., Appl. Phys. Lett. 69, 29983000 (1996).CrossRefGoogle Scholar
20.Dubois, J.M., in New Horizons in Quasicrystals: Research and Applications, edited by Goldman, A.I., Sordelet, D.J., Thiel, P.A., and Dubois, J.M. (World Scientific, Singapore, 1997), pp. 208215.Google Scholar
21.Kelton, M.F. and Gibbons, P.C., MRS Bull. 22(11), 69 (1997).CrossRefGoogle Scholar
22.Kim, J.Y., Gibbons, P.C., and Kelton, K.F., J. Alloys Compd. 266, 311317 (1998).CrossRefGoogle Scholar
23.Rouxel, D., Gavatz, M., Pigeat, P., Weber, B., and Plaindoux, P., in New Horizons in Quasicrystals: Research and Applications, edited by Goldman, A.I., Sordelet, D.J., Thiel, P.A., and Dubois, J.M. (World Scientific, Singapore, 1997), pp. 173180.Google Scholar
24.Gavatz, M., Rouxel, D., Claudel, D., Pigeat, P., Weber, B., and Dubois, J.M., in Proceedings of the 6th International Conference on Quasicrystals (ICQ6), edited by Takeuchi, S. and Fujiwara, T. (World Scientific, Singapore, 1998), pp. 765768.Google Scholar
25.Jenks, C.J., Pinhero, P.J., Chang, S-L., Anderegg, J.W., Besser, M.F., Sordelet, D.J., and Thiel, P.A., in New Horizons in Quasicrystals: Research and Applications, edited by Goldman, A.I., Sordelet, D.J., Thiel, P.A., and Dubois, J. M. (World Scientific, Singapore, 1997), pp. 157164.Google Scholar
26.Chang, S-L., Zhang, C-M., Jenks, C.J., Anderegg, J.W., and Thiel, P.A., in Proceedings of the 5th International Conference on Quasicrystals (ICQ5), edited by Janot, C. and Mosseri, R. (World Scientific, Singapore, 1995), pp. 786789.Google Scholar
27.Chang, S-L., Chin, W.B., Zhang, C-M., Jenks, C.J., and Thiel, P.A., Surf. Sci. 337, 135146 (1995).CrossRefGoogle Scholar
28.Chang, S-L., Anderegg, J.W., and Thiel, P.A., J. Non-Cryst. Solids 195, 95101 (1996).CrossRefGoogle Scholar
29.Suzuki, S., Waseda, Y., Tamura, N., and Urban, K., Scripta Mater. 35, 891895 (1996).CrossRefGoogle Scholar
30.Gu, T., Goldman, A.I., Pinhero, P., and Delaney, D., in New Horizons in Quasicrystals: Research and Application, edited by Goldman, A.I., Sordelet, D.J., Thiel, P.A., and Dubois, J.M. (World Scientific, Singapore, 1997), pp. 165168.Google Scholar
31.Pinhero, P.J., Chang, S-L., Anderegg, J.W., and Thiel, P.A., Philos. Mag. B 75, 271281 (1997).CrossRefGoogle Scholar
32.Jenks, C.J., Pinhero, P.J., Bloomer, T.E., Chang, S-L., Anderegg, J.W., and Thiel, P.A., in Proceedings of the 6th International Conference on Quasicrystals (ICQ6), edited by Takeuchi, S. and Fujiwara, T. (World Scientific, Singapore, 1998), pp. 761.Google Scholar
33.Pinhero, P.J., Anderegg, J.W., Sordelet, D.J., Besser, M.F., and Thiel, P.A., Philos. Mag. B 79, 91110 (1999).CrossRefGoogle Scholar
34.Shen, Z., Pinhero, P.J., Lograsso, T.A., Delaney, D.W., Jenks, C.J., and Thiel, P.A., Surf. Sci. 385, L923–L929 (1997).CrossRefGoogle Scholar
35.Lograsso, T.A. and Delaney, D.W., J. Mater. Res. 11, 2125 (1996).CrossRefGoogle Scholar
36.Lograsso, T.A. and Delaney, D.W., in Proceedings of the 6th International Conference on Quasicrystals (ICQ6), edited by Takeuchi, S. and Fujiwara, T. (World Scientific, Singapore, 1998), pp. 325328.Google Scholar
37.Hoffman, A., Maniv, T., and Folman, M., Surf. Sci. 193, 5780 (1988).CrossRefGoogle Scholar
38.Mesarwi, A. and Ignatiev, A., J. Appl. Phys. 71, 1943 (1992).CrossRefGoogle Scholar
39.Libuda, J., Winkelmann, F., Bäumer, M., Freund, H-J., Bertrams, T., Neddermeyer, H., and Müller, K., Surf. Sci. 318, 61 (1994).CrossRefGoogle Scholar
40.Strohmeier, B.R., Surf. Interface Anal. 15, 51 (1990).CrossRefGoogle Scholar
41.Fadley, C.S., Basic Concepts of X-ray Photoelectron Spectros-copy, Electron Spectroscopy: Theory, Techniques, and Applications Vol. 2, edited by Brundle, C.R. and Baker, A.D. (Academic Press, New York, 1978).Google Scholar