Hostname: page-component-78c5997874-xbtfd Total loading time: 0 Render date: 2024-11-19T11:04:27.317Z Has data issue: false hasContentIssue false
  • English
  • Français

Structural characterization of La2−xMxCuO4 (M = Sr,Ba) samples by synchrotron x-ray and neutron powder diffraction techniques

Published online by Cambridge University Press:  31 January 2011

D. E. Cox ,
S. C. Moss ,
R. L. Meng ,
P. H. Hor  and
C. W. Chu
D. E. Cox
Affiliation:
Department of Physics, Brookhaven National Laboratory, Upton, New York 11973
S. C. Moss
Affiliation:
Department of Physics, University of Houston, Houston, Texas 77004
R. L. Meng
Affiliation:
Department of Physics and Texas Center for Superconductivity, University of Houston, Houston, Texas 77004
P. H. Hor
Affiliation:
Department of Physics and Texas Center for Superconductivity, University of Houston, Houston, Texas 77004
C. W. Chu
Affiliation:
Department of Physics and Texas Center for Superconductivity, University of Houston, Houston, Texas 77004
Get access

Abstract

High-resolution synchrotron x-ray powder diffraction studies on samples of La2−xMxCuO4 (M = Sr,Ba) prepared by standard ceramic techniques show that macroscopic compositional inhomogeneities may exist that are unlikely to be revealed by conventional x-ray diffraction methods. Rietveld refinement of neutron data collected at 200, 50, and 11 K from one such sample, nominally La1.8Sr0.2CuO4, gave satisfactory fits to a tetragonal structure of K2NiF4 type at all three temperatures. However, careful individual peak fits revealed that part of the sample transforms to orthorhombic between 200 and 50 K. It is suggested that this multiphase character has an important influence on the superconducting properties.

Type
Articles
Information
Journal of Materials Research , Volume 3 , Issue 6 , December 1988 , pp. 1327 - 1335
Copyright
Copyright © Materials Research Society 1988

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1Jorgensen, J. D., Jpn. J. Appl. Phys. 26, Suppl. 26-3, 2018 (1987).CrossRefGoogle Scholar
2Nguyen, N., Choisnet, J., Hervieu, M., and Raveau, B., J. Solid State Chem. 39, 120 (1981).CrossRefGoogle Scholar
3Nguyen, N., Studer, F., and Raveau, B., J. Phys. Chem. Solids 44, 389 (1983).CrossRefGoogle Scholar
4Michel, C. and Raveau, B., Rev. Chem. Mineral. 21, 407 (1984).Google Scholar
5Kanbe, S., Kishio, K., Kitazawa, K., Fueki, K., Takagi, H., and Tanaka, S., Chem. Lett. 46, 547 (1987).CrossRefGoogle Scholar
6Tarascon, J. M., Greene, L. H., McKinnon, W. R., Hull, G. W., and Geballe, T. H., Science 235, 1373 (1987).CrossRefGoogle Scholar
7Fujita, T., Aoki, Y., Maeno, Y., Sakurai, J., Fukuba, H., and Fujii, H., Jpn. J. Appl. Phys. Lett. 26, 368 (1987).CrossRefGoogle Scholar
8Oh-ishi, K., Kikuchi, M., Syono, Y., Hiraga, K., and Morioka, Y., Jpn. J. Appl. Phys. Lett. 26, 484 (1987).CrossRefGoogle Scholar
9Moodenbaugh, A. R., Xu, Y., and Suenaga, M., Proc. Mater. Res. Soc. 99, 427 (1987).CrossRefGoogle Scholar
10Fleming, R. M., Batlogg, B., Cava, R. J., and Rietman, E. A., Phys. Rev. B 35, 7191 (1987).CrossRefGoogle Scholar
11Moss, S. C., Forster, K., Axe, J. D., You, H., Hohlwein, D., Cox, D. E., Hor, P. H., Meng, R. L., and Chu, C. W., Phys. Rev. B 35, 7195 (1987).CrossRefGoogle Scholar
12Moret, R., Pouget, J. P., and Collins, G., Europhys. Lett. 4, 365 (1987).CrossRefGoogle Scholar
13Decroux, M., Junod, A., Bezinge, A., Cattani, D., Cors, J., Jorda, J. L., Stettler, A., Francois, M., Yvon, K., Fischer, O., and Muller, J., Europhys. Lett. 3, 1035 (1987).CrossRefGoogle Scholar
14Collin, G. and Comes, R., Acad, C.R.. Sci. Paris 304, Ser. II, 1159 (1987).Google Scholar
15Onoda, M., Shamoto, S., Sato, M., and Hosoya, S., Jpn, J. Appl. Phys. Lett. 26, 363 (1987).CrossRefGoogle Scholar
16Wang, H. H., Geiser, U., Thorn, R. J., Carlson, K. D., Beno, M. A., Monaghan, M. R., Allen, T. J., Proksch, R. B., Stupka, D. L., Kwok, W. K., Crabtree, G. W., and Williams, J. M., Inorg. Chem. 26, 1190 (1987).CrossRefGoogle Scholar
17Jorgensen, J. D., Schuttler, H. B., Hinks, D. G., Capone, D. W. II , Zhang, K., Brodsky, M. B., and Scalapino, D. J., Phys. Rev. Lett. 58, 1024 (1987).CrossRefGoogle Scholar
18Cava, R. J., Santoro, A., Johnson, D. W. Jr , and Rhodes, W. W., Phys. Rev. B 35, 6716 (1987).CrossRefGoogle Scholar
19Francois, M., Yvon, K., Fischer, P., and Decroux, M., Solid State Commun. 63, 35 (1987).CrossRefGoogle Scholar
20Day, P., Rosseinsky, M., Prassides, K., David, W. I. F., Moze, O., and Soper, A., J. Phys. C 20, L429 (1987).Google Scholar
21Paul, D. McK., Balakrishnan, G., Bernhoeft, N. R., David, W. I. F., and Harrison, W. T. A., Phys. Rev. Lett. 58, 1976 (1987).CrossRefGoogle Scholar
22Lang, M., Steglich, F., Schefzyk, R., Lechner, T., Spille, H., Rietschel, H., Goldacker, W., and Renker, B., Europhys. Lett. 4, 1145 (1987).CrossRefGoogle Scholar
23Egami, T., Dmowski, W., Jorgensen, J. D., Hinks, D. G., Capone, D. W. II , Segre, C. U., and Zhang, K., Inter. Conf. on Superconductivity, Drexel (1987).Google Scholar
24Cox, D. E., Hastings, J. B., Cardoso, L. P., and Finger, L. W., Mater. Sci. Forum 9, 1 (1986).CrossRefGoogle Scholar
25Young, R. A. and Wiles, D. B., J. Appl. Cryst. 15, 430 (1982).CrossRefGoogle Scholar
26Wertheim, G. K., Butler, M. A., West, K. W., and Buchanan, D. N. E., Rev. Sci. Instrum. 45, 1369 (1974).CrossRefGoogle Scholar
27Nguyen, N., Er-Rakho, L., Michel, C., Choisnet, J., and Raveau, B., Mater. Res. Bull. 15, 891 (1980).CrossRefGoogle Scholar
28Rietveld, H. M., J. Appl. Cryst. 2, 65 (1969).CrossRefGoogle Scholar
29Hinks, D. G., Dabrowski, B., Zhang, K., Segre, C. U., Jorgensen, J. D., Soderholm, L., and Beno, M., Proc. Mater. Res. Soc. 99, 9 (1987).CrossRefGoogle Scholar
30Moodenbaugh, A. R., Cox, D. E., Hurst, J. J., Asano, T., Sabatini, R. L., and Suenaga, M., in Advances in Cryogenic Engineering, edited by Clark, A. F. and Reid, R. P. (Plenum, New York, 1988), Vol. 34, p. 603.Google Scholar
31You, H., Axe, J. D., Kan, X. B., Moss, S. C., Liu, J. Z., and Lam, D. J., Phys. Rev. B 37, 2301 (1988).CrossRefGoogle Scholar
32You, H., Axe, J. D., Kan, X. B., Moss, S. C., Hashimoto, S., Liu, J. Z., Crabtree, G. W., and Lam, D. J., Phys. Rev. Lett. (submitted).Google Scholar