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The structural changes of polycrystalline film C60/C70: Ni caused by Ni diffusion

Published online by Cambridge University Press:  31 January 2011

E. Czerwosz ,
P. Byszewski ,
R. Diduszko ,
H. Wronka ,
P. Dluźewski  and
E. Mizera
E. Czerwosz
Affiliation:
Institute of Vacuum Technology, 00-241 Warsaw, Poland
P. Byszewski
Affiliation:
Institute of Vacuum Technology, 00-241 Warsaw, Poland and Institute of Physics, Polish Academy of Sciences, 02-628 Warsaw, Poland
R. Diduszko
Affiliation:
Institute of Vacuum Technology, 00-241 Warsaw, Poland
H. Wronka
Affiliation:
Institute of Vacuum Technology, 00-241 Warsaw, Poland
P. Dluźewski
Affiliation:
Institute of Physics, Polish Academy of Sciences, 02-628 Warsaw, Poland
E. Mizera
Affiliation:
Institute of Physics, Polish Academy of Sciences, 02-628 Warsaw, Poland
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Abstract

C60/C70: Ni films with 1.5 wt. % Ni concentration obtained by vacuum deposition under different thermal conditions have been investigated. The structural changes of the layers were investigated by transmission electron microscopy, electron and x-ray diffraction, and Raman spectroscopy. The polycrystalline structure was detected for the layers grown at approximately 450 K on the substrate. At elevated temperature and maintained temperature gradient on the substrate during the process, the changes of the layer's structure and the formation of Ni microcrystals were observed. The Ni microcrystals (5–10 nm in the diameter) and the elongated shapes dimensioned 10 × 150 nm were perceived.

Type
Articles
Information
Journal of Materials Research , Volume 11 , Issue 12 , December 1996 , pp. 3146 - 3151
Copyright
Copyright © Materials Research Society 1996

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