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Strength and interface-constrained plasticity in thin metal films

Published online by Cambridge University Press:  03 March 2011

Y-L. Shen
Affiliation:
Department of Mechanical Engineering, University of New Mexico, Albuquerque, New Mexico 87131
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Abstract

This study seeks to provide a mechanistic rationale for the substrate confinement effect on the strength and plasticity of thin metal films. Atomistic simulations of tensile loading of the freestanding and substrate-bonded films were carried out. Particular attention was devoted to correlating the overall mechanical response and the defect mechanisms on the atomic scale. The existence of an interface with the underlying substrate was observed to constrain significantly the dislocation motion in the film. The extent of film strengthening due to the substrate was dictated by the capability of atoms to slide along the interface.

Type
Rapid Communications
Copyright
Copyright © Materials Research Society 2003

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References

REFERENCES

1.Nix, W.D., Metall. Trans. A 20A, 2217 (1989).CrossRefGoogle Scholar
2.Heinen, D., Bohn, H.G., and Schilling, W., J. Appl. Phys. 77, 3742 (1995).CrossRefGoogle Scholar
3.Thompson, C.V., J. Mater. Res. 8, 237 (1993).CrossRefGoogle Scholar
4.Keller, R-M., Baker, S.P., and Arzt, E., J. Mater. Res. 13, 1307 (1998).CrossRefGoogle Scholar
5.Nix, W.D., Scripta Mater. 39, 545 (1998).CrossRefGoogle Scholar
6.Dehm, G., Weiss, D., and Arzt, E., Mater. Sci. Eng. A 309, 468 (2001).CrossRefGoogle Scholar
7.Legros, M., Hemker, K.J., Gouldstone, A., Suresh, S., Keller-Flaig, R-M., and Arzt, E., Acta Mater. 50, 3435 (2002).CrossRefGoogle Scholar
8.Morse, P.M., Phys. Rev. 34, 57 (1929).CrossRefGoogle Scholar
9.Phillips, R., Crystals, Defects and Microstructures-Modeling Across Scales (Cambridge University Press, Cambridge, U.K., 2001), p. 206.CrossRefGoogle Scholar
10.Arzt, E., Dehm, G., Gumbsch, P., Kraft, O., and Weiss, D., Prog. Mater. Sci. 46, 283 (2001).CrossRefGoogle Scholar
11.Kraft, O., Freund, L.B., Phillips, R., and Arzt, E., Mater. Res. Bull. 27(1), 30 (2002).CrossRefGoogle Scholar