Hostname: page-component-586b7cd67f-r5fsc Total loading time: 0 Render date: 2024-11-26T18:06:00.209Z Has data issue: false hasContentIssue false
  • English
  • Français

The stability of the surface of La2CuO4 to reactions with adsorbed n-butyl amine: X-ray photoelectron spectroscopy study

Published online by Cambridge University Press:  03 March 2011

S. Badrinarayanan ,
A.B. Mandale ,
S.R. Sainkar ,
N.R. Pavaskar  and
V. Ramaswamy
S. Badrinarayanan*
Affiliation:
Special Instruments Laboratory, National Chemical Laboratory, Pune-411008, India
A.B. Mandale
Affiliation:
Special Instruments Laboratory, National Chemical Laboratory, Pune-411008, India
S.R. Sainkar
Affiliation:
Special Instruments Laboratory, National Chemical Laboratory, Pune-411008, India
N.R. Pavaskar
Affiliation:
Special Instruments Laboratory, National Chemical Laboratory, Pune-411008, India
V. Ramaswamy
Affiliation:
Special Instruments Laboratory, National Chemical Laboratory, Pune-411008, India
*
a)Address all correspondence to this author.
Get access

Abstract

The reaction of n-butyl amine adsorbed on the ternary oxide La2CuO4 has been studied by x-ray photoelectron spectroscopy (XPS), paying special attention to the surface composition. We suggest that n-butyl amine reacting with La2CuO4 reduces CuO to Cu2O. The reaction is confined to the surface because the original composition of the material could be restored after in situ scraping with a stainless steel blade.

Type
Articles
Information
Journal of Materials Research , Volume 9 , Issue 5 , May 1994 , pp. 1140 - 1146
Copyright
Copyright © Materials Research Society 1994

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1Horn, S., Cai, J., Shaheen, S. A., Jeon, Y., Croft, M., Chang, C. L., and Denboer, M. L., Phys. Rev. B 36, 3895 (1987).CrossRefGoogle Scholar
2Sarma, D. D. and Rao, C.N. R., Solid State Commun. 65, 47 (1988).CrossRefGoogle Scholar
3Ford, W. K., Chen, C. T., Anderson, J., Kwo, J., Liou, S. H., Hong, M., Rubenacker, G. V., and Drumheller, J. E., Phys. Rev. B 37, 7924 (1988).CrossRefGoogle Scholar
4Gourieux, J., Krill, G., Maurer, M., Ravet, M. F., Menny, A., Tolentino, H., and Fontanie, A., Phys. Rev. B 37, 7516 (1988).Google Scholar
5Meyer, H. M., Hill, D. M., Wagener, T. J., Gao, Y., Weaver, J., Capone, D. W., and Goretta, K. C., Phys. Rev. B 38, 6500 (1988).CrossRefGoogle Scholar
6Rogers, J. W., Shinn, N. D., Schirber, J. E., Venturini, E. L., Ginley, D. G., and Morosin, B., Phys. Rev. B 38, 5021 (1988).CrossRefGoogle Scholar
7Chang, C. C., Hegde, M. S., Wu, X. D., Dutta, B., Inam, A., Venkatesan, T., Wilkens, B. J., and Wachtman, J. B., J. Appl. Phys. 67, 7483 (1990).CrossRefGoogle Scholar
8Carley, A. F., Roberts, M. W., Lees, J. S., and Tilley, R.J.D., J. Chem. Soc. Faraday Trans. 86, 3129 (1990).CrossRefGoogle Scholar
9Sarma, D. D., Sreedhar, K., Ganguly, P., and Rao, C.N.R., Phys. Rev. B 36, 2371 (1987).CrossRefGoogle Scholar
10Rao, C. N. R., Ganguly, P., Gopalakrishnan, J., and Sarma, D. D., Mater. Res. Bull. XXII, 1159 (1987).CrossRefGoogle Scholar
11Anisimov, V. I., Korotin, M. A., and Kurmaev, E. Z., J. Electron. Spectrosc. Relat. Phenom. 50, 213 (1990).CrossRefGoogle Scholar
12Takahashi, T., Maeda, F., Katayama-Yoshida, H., Okabe, Y., and Suzuki, T., Phys. Rev. B 37, 9788 (1988).CrossRefGoogle Scholar
13Iqbal, Z., Leone, E., Chin, R., Signorelli, A. J., Bose, A., and Eckhardt, H., J. Mater. Res. 2, 768 (1987).CrossRefGoogle Scholar
14Jenny, H., Walz, B., Leeman, G., Geiser, V., Jost, S., Frey, T., and Güntherodt, H-J., J. Mater. Res. 2, 775 (1987).CrossRefGoogle Scholar
15Hegde, M. S., Mater. Res. Bull. XXIII, 1171 (1988).CrossRefGoogle Scholar
16Structor report, 39(A), 252, edited by Trotter, J., Oosthoek, Scheltema and Holkema, Utrecht for the International Union of Crystallography, The Netherlands, 1973.Google Scholar
17Kamiyama, T., Izumi, F., Asano, H., Takagi, H., Uchida, S., Tokura, Y., Takayam Muromachi, E., Matsuda, M., Yamada, K., Endoh, Y., and Hidaka, Y., Physica C 172, 120 (1990).CrossRefGoogle Scholar
18Michel, C. and Raveau, B., Revue de Chimie Minerale, t21, 407 (1984).Google Scholar
19Richter, K. and Peplinski, B., J. Electron. Spectrosc. Relat. Phenom. 13, 69 (1978).CrossRefGoogle Scholar
20Practical Surface Analysis by Auger and X-ray Photoelectron Spectroscopy edited by Briggs, D. and Seah, M. P. (John Wiley and Sons, New York, 1984), p. 447.Google Scholar
21Badrinarayanan, S., Ganguly, P., Mandale, A. B., and Sainker, S. R., J. Electron. Spectrosc. Relat. Phenom. 59, 307 (1992).CrossRefGoogle Scholar
22Losev, A., Kostov, K., and Tyuliev, G., Surf. Sci. 213, 564 (1989).CrossRefGoogle Scholar
23Panzner, G., Egert, B., and Schmidt, H. P., Surf. Sci. 151, 400 (1985).CrossRefGoogle Scholar
24Siegmann, H. C., Schlapbach, L., and Brundle, C. R., Phys. Rev. Lett. 40, 972 (1978).CrossRefGoogle Scholar
25Badrinarayanan, S. and Sinha, S., J. Appl. Phys. Lett. 69, 1141 (1991).Google Scholar
26Hirokawa, K. and Oku, M., Talanta. 27, 741 (1988).CrossRefGoogle Scholar
27Garbassi, F., Surf. Int. Anals. 5, 139 (1983).CrossRefGoogle Scholar
28Inamura, K., Inove, Y., Ikeda, S., and Kishi, K., Surf. Sci. 155, 173 (1985).CrossRefGoogle Scholar
29Johnson, D. B., Matloob, M., and Roberts, M. W., Faraday Trans. (I) 75, 2143 (1979).CrossRefGoogle Scholar
30Roberts, M. W., Proc. Indian Nat. Sci. Acad. 51A, 165 (1985).Google Scholar
31Matloob, N. and Roberts, M. W., J. Chem. Res. 5 (12), 336 (1977).Google Scholar
32Hornk, A., Dinardo, J., Eberhardt, W., Frun, H., and Plummer, E. W., Surf. Sci. 118, 465 (1982).CrossRefGoogle Scholar
33Tyeklar, Z. and Karlin, K. D., Ace. Chem. Res. 22, 241 (1989).CrossRefGoogle Scholar