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Site selectivity of Mn atoms in γ–TiAl alloys determined by x-ray scattering

Published online by Cambridge University Press:  31 January 2011

V. Suresh Babu  and
Mohindar S. Seehra
V. Suresh Babu
Affiliation:
Physics Department, West Virginia University, Morgantown, West Virginia 26506
Mohindar S. Seehra*
Affiliation:
Physics Department, West Virginia University, Morgantown, West Virginia 26506
*
a)Address correspondence to this author.
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Abstract

The relative variations of the intensities of the superlattice peaks in the x-ray scattering of Ti50−xMnxAl50 alloys (x = 0, 0.77, 1.85, and 3.30) are used to determine the site occupancy by Mn atoms. It is concluded that up to x = 1.85, Mn occupies the Ti sites whereas for x = 3.30, some Al sites may also be occupied in the L10 structure of γ–TiAl alloys.

Type
Articles
Information
Journal of Materials Research , Volume 6 , Issue 2 , February 1991 , pp. 339 - 342
Copyright
Copyright © Materials Research Society 1991

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References

1 See, e.g., High Temperature Ordered Intermetallic Alloys III, edited by Liu, C. T., Taub, A. I., Stoloff, N. S., and Koch, C. C. (Mater. Res. Soc. Symp. Proc. 133, Pittsburgh, PA, 1989).Google Scholar
2Hall, E. L. and Huang, S-C., J. Mater. Res. 4, 595 (1989).CrossRefGoogle Scholar
3Hanamura, T., Uemori, R., and Tanino, M., J. Mater. Res. 3, 656 (1988).CrossRefGoogle Scholar
4Tsujimoto, T. and Hashimoto, K., Ref. 1, page 391.Google Scholar
5Chubb, S. R., Papaconstantopoulos, D. A., and Klein, B. M., Phys. Rev. B 38, 12120 (1988).CrossRefGoogle Scholar
6Lin, H. and Pope, D. P., J. Mater. Res. 5, 763 (1990).CrossRefGoogle Scholar
7Cullity, B. D., Elements of X-Ray Diffraction, 2nd ed. (Addison-Wesley, 1978), p. 139.Google Scholar
8International Tables for X-Ray Crystallography (Kynoch Press, Birmingham, England), Vol. III, p. 233 and Vol. IV, pp. 71–91.Google Scholar
9Coletti, J., Babu, V. Suresh, Pavlovic, A. S., and Seehra, M. S., Phys. Rev. B (in press).Google Scholar
10Khowash, P. K., Price, D. L., and Cooper, B. R., Phys. Rev. B (submitted for publication).Google Scholar