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Scanning tunneling spectroscopy of carbon nanotubes

Published online by Cambridge University Press:  03 March 2011

Charles H. Olk  and
Joseph P. Heremans
Charles H. Olk
Affiliation:
General Motors Research, Warren, Michigan 48090
Joseph P. Heremans
Affiliation:
General Motors Research, Warren, Michigan 48090
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Abstract

Calculations predict that carbon nanotubes may exist as either semimetals or semiconductors, depending on diameter and degree of helicity. This communication presents experimental evidence supporting the calculations. Scanning tunneling microscopy and spectroscopy (STM-S) data taken in air on nanotubes with outer diameters from 17 to 90 Å show evidence of one-dimensional behavior; the current-voltage (I-V) characteristics are consistent with a density of states containing Van Hove type singularities for which the energies vary linearly with inverse nanotube diameter.

Type
Rapid Communications
Information
Journal of Materials Research , Volume 9 , Issue 2 , February 1994 , pp. 259 - 262
Copyright
Copyright © Materials Research Society 1994

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References

REFERENCES

1Iijima, S., Nature 354, 56 (1991).CrossRefGoogle Scholar
2Iijima, S., Ajayan, P. M., and Ichihashi, T., Phys. Rev. Lett. 69, 3100 (1992).CrossRefGoogle Scholar
3Ebbesen, T. W. and Ajayan, P. M., Nature 358, 220 (1992).CrossRefGoogle Scholar
4Ge, M. and Sattler, K., Science 260, 515 (1993).CrossRefGoogle Scholar
5Gallagher, M. J., Chen, D., Jacobsen, B. P., Sarid, D., Lamb, L. D., Tinker, F. A., Jiao, J., Huffman, D. R., Seraphin, S., and Zhou, D., Surf. Sci. Lett. 281, L335 (1993).CrossRefGoogle Scholar
6Saito, R., Fujita, M., Dresselhaus, G., and Dresselhaus, M. S., Appl. Phys. Lett. 60, 2204 (1992).CrossRefGoogle Scholar
7White, C. T., Robertson, D. H., and Mintmire, J. W., Phys. Rev. B 47, 5485 (1993).CrossRefGoogle Scholar
8Saito, R., Fujita, M., Dresselhaus, G., and Dresselhaus, M. S., Phys. Rev. B 46, 1804 (1992).CrossRefGoogle Scholar
9Mintmire, J. W., Dunlap, B. I., and White, C. T., Phys. Rev. Lett. 68, 631 (1992).CrossRefGoogle Scholar
10Hamada, N., Sawada, S. I., and Oshiyama, A., Phys. Rev. Lett. 68, 1579 (1992).CrossRefGoogle Scholar
11Harigaya, K., Phys. Rev. B 45, 12071 (1992).CrossRefGoogle Scholar
12Saito, R., Dresselhaus, G., and Dresselhaus, M. S., J. Appl. Phys. 73, 494 (1993).CrossRefGoogle Scholar
13Oik, C. H., Heremans, J., Dresselhaus, M. S., Speck, J. S., and Nicholls, J. T., Phys. Rev. B 42, 7524 (1990).Google Scholar
14Binning, G., Rohrer, H., Gerber, Ch., and Weibel, E., Phys. Rev. Lett. 49, 57 (1982) and 50, 120 (1983).CrossRefGoogle Scholar
15Venkateswaran, N., Sattler, K., Muller, U., Kaiser, B., Raina, G., and Xhie, J., J. Vac. Sci. Technol. B 9, 1052 (1991).CrossRefGoogle Scholar
16Jobin, M., Emch, R., Zenhausern, F., Steinemann, S., and Descouts, P., J. Vac. Sci. Technol. B 9, 1263 (1991).CrossRefGoogle Scholar
17Zhang, Z., Lieber, CM., Ginley, D. S., Baughman, R. J., and Morosin, B., J. Vac. Sci. Technol. B 9, 1009 (1991).CrossRefGoogle Scholar
18Enomoto, H., Ozaki, H., Suzuki, M., Fujii, T., and Yamaguchi, M., J. Vac. Sci. Technol. B 9, 1022 (1991).CrossRefGoogle Scholar
19Simmons, J. G., J. Appl. Phys. 34, 1793 (1963).CrossRefGoogle Scholar
20Gimzewski, J. K. and Moller, R., Phys. Rev. B 36, 1284 (1987).CrossRefGoogle Scholar
21Mamin, H. J., Ganz, E., Abraham, D. W., Thomson, R. E., and Clarke, J., Phys. Rev. B 34, 9015 (1986).CrossRefGoogle Scholar
22Gimzewski, J. K., Moller, R., Pohl, D. W., and Schlittler, R. R., Surf. Sci. 189/190, 15 (1983).CrossRefGoogle Scholar
23Gomez-Rodriguez, J. M., Gomez-Herrero, J., and Baro, A. M., Surf. Sci. 220, 152 (1989).CrossRefGoogle Scholar
24Schuster, R., Barth, J. V., Wintterlin, J., Behm, R. J., and Ertl, G., Ultramicroscopy 42–44, 533 (1992).CrossRefGoogle Scholar
25Chen, C. L. and Hamers, R. J., J. Vac. Sci. Technol. B 9, 503 (1991).CrossRefGoogle Scholar
26Lang, N. D., Phys. Rev. B 37, 10395 (1988).CrossRefGoogle Scholar
27Pitarke, J. M., Echenique, P. M., and Flores, F., Surf. Sci. 217, 267 (1989).CrossRefGoogle Scholar
28Lucas, A. A., Vigneron, J. P., Lambin, Ph., Laloyaux, Th., and Derycke, I., Surf. Sci. 269/270, 74 (1992).CrossRefGoogle Scholar
29Reed, M. A., Randall, J. N., Aggarwal, R. J., Matyi, R. J., Moore, T. M., and Wetsel, A. E., Phys. Rev. Lett. 60, 535 (1988).CrossRefGoogle Scholar
30Reed, M. A., Sci. Am., 123, January (1993).Google Scholar