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RBS and XPS analyses of phosphor packages for laser-heat thermoluminescence dosimetry

Published online by Cambridge University Press:  31 January 2011

S.H. Stern ,
J.L. Price ,
D.G. Simons ,
D.J. Land ,
V.K. Mathur ,
C.R. Anderson  and
B.C. Beard
S.H. Stern
Affiliation:
United States Naval Surface Warfare Center, Silver Spring, Maryland 20903–5000
J.L. Price
Affiliation:
United States Naval Surface Warfare Center, Silver Spring, Maryland 20903–5000
D.G. Simons
Affiliation:
United States Naval Surface Warfare Center, Silver Spring, Maryland 20903–5000
D.J. Land
Affiliation:
United States Naval Surface Warfare Center, Silver Spring, Maryland 20903–5000
V.K. Mathur
Affiliation:
United States Naval Surface Warfare Center, Silver Spring, Maryland 20903–5000
C.R. Anderson
Affiliation:
United States Naval Surface Warfare Center, Silver Spring, Maryland 20903–5000
B.C. Beard
Affiliation:
United States Naval Surface Warfare Center, Silver Spring, Maryland 20903–5000
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Abstract

Phosphor packages for a laser-heat thermoluminescence radiation-dosimetry system have been analyzed with Rutherford Backscattering Spectrometry and X-ray Photoelectron Spectroscopy. Samples consist of 20–50 μm diameter powder grains of CaSO4: Tm and LiF: (Mg, Ti) phosphor embedded in a transparent silicone matrix about 60 μm thick. Our principal finding with regard to layer morphology indicates an inhomogeneous outer layer of areal density at least ∼300 μg/cm2 depleted of phosphor and contaminated with boron.

Type
Articles
Information
Journal of Materials Research , Volume 6 , Issue 7 , July 1991 , pp. 1574 - 1579
Copyright
Copyright © Materials Research Society 1991

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References

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