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Poly(vanadium–molybdenum acid) xerogel thin films fabricated by the sol-gel process and their humidity-sensing properties

Published online by Cambridge University Press:  31 January 2011

Maosong Tong ,
Guorui Dai ,
Yuanda Wu ,
Xiuli He ,
Wei Yan ,
Dingsan Gao ,
Victor Volkov  and
Galina Zakharova
Maosong Tong
Affiliation:
Department of Electronic Engineering, National Integrated Optoelectronics Laboratory, Jilin University, Changchun 130023, China
Guorui Dai*
Affiliation:
Department of Electronic Engineering, National Integrated Optoelectronics Laboratory, Jilin University, Changchun 130023, China
Yuanda Wu
Affiliation:
Department of Electronic Engineering, National Integrated Optoelectronics Laboratory, Jilin University, Changchun 130023, China
Xiuli He
Affiliation:
Department of Electronic Engineering, National Integrated Optoelectronics Laboratory, Jilin University, Changchun 130023, China
Wei Yan
Affiliation:
Department of Electronic Engineering, National Integrated Optoelectronics Laboratory, Jilin University, Changchun 130023, China
Dingsan Gao
Affiliation:
Institute of Solid State Chemistry, Ural Branch of the Russian Academy of Sciences, 91,620291, Jekterinburg, Russia
Victor Volkov
Affiliation:
Institute of Solid State Chemistry, Ural Branch of the Russian Academy of Sciences, 91,620291, Jekterinburg, Russia
Galina Zakharova
Affiliation:
Institute of Solid State Chemistry, Ural Branch of the Russian Academy of Sciences, 91,620291, Jekterinburg, Russia
*
a)Address all correspondence to this author.[email protected]
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Abstract

Thermogravimetric analysis, x-ray photoelectron spectroscopy, and x-ray diffraction results and the humidity sensing properties of poly(vanadium–molybdenum acid) H2V9.5Mo2.5O32.0 · 8.8H2O xerogel thin films, which were fabricated by the sol-gel process, are described in this paper. The conductance and the capacitance of the thin films strongly depend on the relative humidity. Different electrodes have different influences on the humidity-sensing properties of the thin films.

Type
Articles
Information
Journal of Materials Research , Volume 15 , Issue 12 , December 2000 , pp. 2653 - 2657
Copyright
Copyright © Materials Research Society 2000

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References

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