Hostname: page-component-cd9895bd7-lnqnp Total loading time: 0 Render date: 2024-12-23T11:25:03.399Z Has data issue: false hasContentIssue false

Photobleaching of sol-gel-derived germanium oxide glass thin films

Published online by Cambridge University Press:  31 January 2011

Jae Hyeok Jang
Affiliation:
Laboratory of Optical Materials and Coating (LOMC), Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology (KAIST), Taejon 305-701, Korea
Junmo Koo
Affiliation:
Laboratory of Optical Materials and Coating (LOMC), Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology (KAIST), Taejon 305-701, Korea
Byeong-Soo Bae
Affiliation:
Laboratory of Optical Materials and Coating (LOMC), Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology (KAIST), Taejon 305-701, Korea
Get access

Abstract

Photobleaching of the optical absorption band in the 5-eV region of sol-gel-derived germanium oxide glass thin films was examined with the irradiation of the 5-eV light. The photobleaching represented by the saturated absorption coefficient change (−Δα) and the ratio of the neutral oxygen monovacancies to neutral oxygen divacancies concentrations for the germanium oxide were 175 cm−1 and 0.113, respectively. These values are larger than those of the pure germanium oxide bulk glass as well as germanosilicate thin films. The changes in bonding configuration around Ge atom by ultraviolet illumination were analyzed using x-ray photoelectron spectroscopy.

Type
Articles
Copyright
Copyright © Materials Research Society 2000

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1.Hill, K.O., Fujii, Y., Johnson, D.C., and Kawasaki, B.S., Appl. Phys. Lett. 32, 647 (1978).CrossRefGoogle Scholar
2.Friebele, E.J. and Griscom, D.L., in Defects in Glasses, edited by Galeener, F.L., Griscom, D.L., and Weber, M.J. (Mater. Res. Soc. Symp. Proc. 61, Pittsburgh, PA, 1986), p. 319.Google Scholar
3.Cohen, A.J. and Smith, H.L., J. Phys. Chem. Solids 7, 301 (1958).CrossRefGoogle Scholar
4.Hosono, H., Abe, Y., Kinser, D. L., Weeks, R. A., Muta, K., and Kawazoe, H., Phys. Rev. B 46, 11445 (1992).CrossRefGoogle Scholar
5.Hosono, H., Kawamura, K., Ueda, N., Kawazoe, H., Fujitsu, S., and Matunami, N., J. Phys.: Condens. Matter 7, L343 (1995).Google Scholar
6.Hand, D.P. and Russell, P.St.J., Opt. Lett. 15, 102 (1990).CrossRefGoogle Scholar
7.Dong, L., Archambault, J.L., Reekie, L., Russell, P.St.J., and Payne, D.N., Appl. Opt. 34, 3436 (1995).CrossRefGoogle Scholar
8.Hosono, H., Kawazoe, H., and Muta, K. I., Appl. Phys. Lett. 63, 479 (1993).CrossRefGoogle Scholar
9.Nishii, J., Yamanaka, H., Hosono, H., and Kawazoe, H., Appl. Phys. Lett. 64, 282 (1994).CrossRefGoogle Scholar
10.Jang, J.H., Koo, J., and Bae, B.S., J. Am. Ceram. Soc. (2000, in press)Google Scholar
11.Yuen, M.J., Appl. Opt. 21, 136 (1982).CrossRefGoogle Scholar
12.Kekkay, T., Sacher, E., and Yelon, A., Surf. Sci. 217, L377 (1989).Google Scholar
13.Wang, P.W., Qi, Y., and Herderson, D.O., J. Non-Cryst. Solids 224, 31 (1998).CrossRefGoogle Scholar