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Oxygen diffusion through dielectrics: A critical parameter in high critical temperature superconductors multilayer technology

Published online by Cambridge University Press:  03 March 2011

S.C. Tidrow ,
W.D. Wilber ,
A. Tauber ,
S.N. Schauer ,
D.W. Eckart ,
R.D. Finnegan  and
R.L. Pfeffer
S.C. Tidrow*
Affiliation:
U.S. Army Research Laboratory, Electronics and Power Sources Directorate, AMSRL-EP-EC-H, Fort Monmouth. New Jersey 07703-5601
W.D. Wilber
Affiliation:
U.S. Army Research Laboratory, Electronics and Power Sources Directorate, AMSRL-EP-EC-H, Fort Monmouth. New Jersey 07703-5601
A. Tauber*
Affiliation:
U.S. Army Research Laboratory, Electronics and Power Sources Directorate, AMSRL-EP-EC-H, Fort Monmouth. New Jersey 07703-5601
S.N. Schauer*
Affiliation:
U.S. Army Research Laboratory, Electronics and Power Sources Directorate, AMSRL-EP-EC-H, Fort Monmouth. New Jersey 07703-5601
D.W. Eckart
Affiliation:
U.S. Army Research Laboratory, Electronics and Power Sources Directorate, AMSRL-EP-EC-H, Fort Monmouth. New Jersey 07703-5601
R.D. Finnegan
Affiliation:
U.S. Army Research Laboratory, Electronics and Power Sources Directorate, AMSRL-EP-EC-H, Fort Monmouth. New Jersey 07703-5601
R.L. Pfeffer
Affiliation:
U.S. Army Research Laboratory, Electronics and Power Sources Directorate, AMSRL-EP-EC-H, Fort Monmouth. New Jersey 07703-5601
*
a)National Research Council-EPSD Research Associate; presently, an Electronics Engineer at the Army Research Laboratory.
b)Under contract with Geo-Centers, Inc.
b)Under contract with Geo-Centers, Inc.
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Abstract

We have studied the relative diffusion rates of oxygen through dielectric/buffer layers used in high critical temperature superconducting multilayer structures. Epitaxial bilayer films of dielectric (CeO2, LaGaO3, NdGaO3, LaAlO3, MgO, SrTiO3, LaLiTi2O6, or LaNaTi2O6) on YBa2Cu3O7−δ (YBCO) have been deposited onto (001) oriented single-crystal MgO substrates using pulsed laser deposition. These bilayers have been investigated for oxygen diffusion over the temperature range 350 to 650 °C by postdeposition annealing the films for 20 min in 0.5 atm of 18O enriched molecular oxygen gas. Secondary ion mass spectroscopy was used to depth profile the relative concentration of 18O to 16O in each bilayer. Compared to YBCO, the dielectrics MgO, SrTiO3, LaLiTi2O6, and LaNaTi2O6 are relatively slow diffusers, while CeO2, LaGaO3, NdGaO3, and LaAlO3 are relatively fast diffusers.

Type
Articles
Information
Journal of Materials Research , Volume 10 , Issue 7 , July 1995 , pp. 1622 - 1634
Copyright
Copyright © Materials Research Society 1995

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