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Organic molecular-beam deposition of perylene on Cu(110): Results from near-edge x-ray absorption spectroscopy, x-ray photoelectron spectroscopy, and atomic force microscopy

Published online by Cambridge University Press:  03 March 2011

K. Hänel ,
S. Söhnchen ,
S. Lukas ,
G. Beernink ,
A. Birkner ,
T. Strunskus ,
G. Witte  and
Ch. Wöll
K. Hänel
Affiliation:
Physikalische Chemie I, Ruhr-Universität Bochum, 44780 Bochum, Germany
S. Söhnchen
Affiliation:
Physikalische Chemie I, Ruhr-Universität Bochum, 44780 Bochum, Germany
S. Lukas
Affiliation:
Physikalische Chemie I, Ruhr-Universität Bochum, 44780 Bochum, Germany
G. Beernink
Affiliation:
Physikalische Chemie I, Ruhr-Universität Bochum, 44780 Bochum, Germany
A. Birkner
Affiliation:
Physikalische Chemie I, Ruhr-Universität Bochum, 44780 Bochum, Germany
T. Strunskus
Affiliation:
Physikalische Chemie I, Ruhr-Universität Bochum, 44780 Bochum, Germany
G. Witte
Affiliation:
Physikalische Chemie I, Ruhr-Universität Bochum, 44780 Bochum, Germany
Ch. Wöll*
Affiliation:
Physikalische Chemie I, Ruhr-Universität Bochum, 44780 Bochum, Germany
*
a) Address all correspondence to this author. e-mail: [email protected] This author was an editor of this focus issue during the review and decision stage. For the JMR policy on review and publication of manuscripts authored by editors, please refer to http://www.mrs.org/publications/jmr/policy.html.
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Abstract

The growth of the polycyclic aromatic hydrocarbon perylene on (110) oriented copper substrates has been studied by means of x-ray photoelectron spectroscopy, near-edge x-ray absorption spectroscopy, and atomic force microscopy. In the monolayer regime, the molecules are orientated with their molecular plane parallel to the substrate, whereas they adopt a tilted arrangement in multilayer films. For multilayers with thicknesses exceeding 10 nm, the molecules grow in a bulk-like structure with their long axes orientated upright to the substrate surface.

Keywords

Crystal growthMolecular beam expitaxy (MBE)Organic
Type
Articles—Organic Electronics Special Section
Information
Journal of Materials Research , Volume 19 , Issue 7 , July 2004 , pp. 2049 - 2056
Copyright
Copyright © Materials Research Society 2004

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References

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