Hostname: page-component-586b7cd67f-tf8b9 Total loading time: 0 Render date: 2024-11-27T12:07:18.290Z Has data issue: false hasContentIssue false

On-line gas-phase optical diagnostics in plasma CVD deposition of carbon films

Published online by Cambridge University Press:  31 January 2011

R. Fantoni
Affiliation:
ENEA, Area INN, Dip. Sviluppo tecnologie di Punta, P. O. Box 65, 00044 Frascati (RM), Italy
M. Giorgi
Affiliation:
ENEA, Area INN, Dip. Sviluppo tecnologie di Punta, P. O. Box 65, 00044 Frascati (RM), Italy
A.G.G. Moliterni
Affiliation:
ENEA, Area INN, Dip. Sviluppo tecnologie di Punta, P. O. Box 65, 00044 Frascati (RM), Italy
W.C.M. Berden
Affiliation:
ENEA, Area INN, Dip. Sviluppo tecnologie di Punta, P. O. Box 65, 00044 Frascati (RM), Italy
V. Lazic
Affiliation:
ENEA, Area INN, Dip. Sviluppo tecnologie di Punta, P. O. Box 65, 00044 Frascati (RM), Italy
O. Martini
Affiliation:
Eniricerche S.p.A., 00015 Monterotondo (RM), Italy
F. Polla Mattiot
Affiliation:
Eniricerche S.p.A., 00015 Monterotondo (RM), Italy
Get access

Abstract

Space resolved, on-line spontaneous and stimulated emission, and CARS diagnostics have been employed on CH4/H2 mixtures excited by rf-discharge in order to investigate the chemical processes and the gas phase kinetics in the plasma. CH4 and H2 concentration and temperature have been monitored during the process as a function of main reaction parameters (rf-power, total pressure, CH4/H2 ratio). Formation of CH,H2, and H in excited states has been observed. On the basis of present spectroscopic data, a model for the gas-phase reactions accompanying the carbon film deposition is proposed.

Type
Articles
Copyright
Copyright © Materials Research Society 1992

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1.Bubenzer, A., Dischler, B., Brand, G., and Koild, P., J. Appl. Phys. 54, 4590 (1983).CrossRefGoogle Scholar
2.Couderc, P. and Catherine, Y., Thin Solid Films 146, 93 (1987).CrossRefGoogle Scholar
3.Kobayashi, K., Mutsukura, N., and Machi, Y., J. Appl. Phys. 59, 910 (1986).CrossRefGoogle Scholar
4.Harker, A. B. and DeNatale, J. F., J. Mater. Res. 5, 818 (1990).CrossRefGoogle Scholar
5.Gottscho, R. A. and Miller, T. A., Pure … Appl. Chem. 56, 189 (1984); J. Wolfrum, Appl. Phys. B46, 221 (1988).CrossRefGoogle Scholar
6.Druet, S. A. J. and Taran, J. P., Prog. Quantum Electron. 7,1 (1981).CrossRefGoogle Scholar
7.Attal, B., Debarre, D., Muller-Dethlefs, K., and Taran, J. P. E., Rev. Phys. Appl. 18, 39 (1983); K. P. Gross, D. M. Gunthals, and J. W. Nibler, J. Chem. Phys. 70, 4673 (1979).CrossRefGoogle Scholar
8.Attal-Tretout, B., Bouchardy, P., Magre, P., Péalat, M., and Taran, J. P., Appl. Phys. B51, 17 (1990).CrossRefGoogle Scholar
9.Engeln, R., Fantoni, R., and Schina, G., II Nuovo Cimento D 12, 209 (1990).CrossRefGoogle Scholar
10.Fantoni, R., Bijnen, F., Piccirillo, S., and Enzo, S., Chem. Phys. 147, 389 (1990); R. Fantoni, F. Bijnen, N. Djuric, and S. Piccirillo, Laser Chem. 11, 13 (1990); Appl. Phys. B 52, 176 (1991).CrossRefGoogle Scholar
11.Engeln, R. and Fantoni, R., II Nuovo Cimento D 13, 1133 (1991).CrossRefGoogle Scholar
12.Giardini-Guidoni, A., Morone, A., Snels, M., Desimoni, E., Salvi, A. M., Fantoni, R., Berden, W. C. M, and Giorgi, M., Appl. Surf. Sci. 46, 321 (1990).CrossRefGoogle Scholar
13.Hay, S. O., Roman, W. C., and Colket, M. B. III, J. Mater. Res. 5, 2387 (1990).CrossRefGoogle Scholar
14.Barbarossa, V., Galluzzi, F., Mercuri, S., Tomaciello, R., and Grillo, G., in New Diamond Science and Technology, edited by Messier, R., Glass, J. T., Butler, J. E., and Roy, R. (Mater. Res. Soc. Int. Symp. Proc. NDST-2, Pittsburgh, PA, 1991).Google Scholar
15.Ho, P., Buss, R. J., and Loehman, R. E., J. Mater. Res. 4, 873 (1989).CrossRefGoogle Scholar
16.Baas, R. Ch. and Beenakker, C. I. M., Comp. Phys. Comm. 8, 236 (1974).CrossRefGoogle Scholar
17.Beenakker, C. J. M., Verbeek, P. J. F., Mohlmann, G. R., and de, F. J.Heer, Quant. Spectrosc. Radiat. Transfer 15, 333 (1975).CrossRefGoogle Scholar
18.Fantoni, R., Giorgi, M., Moliterni, A. G. G., Berden, W. C. M., Lazic, V., Mattiot, F. Polla, and Martini, O., “On-line gas-phase optical diagnostic in plasma CVD deposition of carbon film,” int. rep. RT/INN/91 ENEA Frascati (in press).Google Scholar
19.Carrington, A. and Ramsey, D. A., Physica Scripta 25, 272 (1982).CrossRefGoogle Scholar
20.Tachibana, K., Nishida, M., Harima, H., and Urano, Y., J. Phys. D:Appl. Phys. 17, 1727 (1984).CrossRefGoogle Scholar
21.Tsuji, M., Kobarai, K., Kouno, H., Obase, H., and Nishimura, Y., J. Chem. Phys. 94, 277 (1991).CrossRefGoogle Scholar
22.Schiavone, J. A., Donahue, D. E., and Freund, R. S., J. Chem. Phys. 67, 759 (1977).CrossRefGoogle Scholar
23.Welch, A. R. and Judge, D. L., J. Chem. Phys. 57, 286 (1972).CrossRefGoogle Scholar
24.Kokubo, T., Tochikubo, F., and Makabe, T., J. Phys. D: Appl. Phys. 22, 1281 (1989).CrossRefGoogle Scholar
25.Kline, L. E., Partlow, W. D., and Bias, W. E., J. Appl. Phys. 65, 70 (1988).CrossRefGoogle Scholar
26.Dieke, G. H., The Hydrogen Molecule Wavelength Tables (Cross-white, 1972).Google Scholar
27.Kojima, H., Toyoda, H., and Sugai, H., Appl. Phys. Lett. 55, 1292 (1989).CrossRefGoogle Scholar