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Observation of fractal patterns in C60-polymer thin films

Published online by Cambridge University Press:  03 March 2011

H.J. Gao ,
Z.Q. Xue ,
Q.D. Wu  and
S. Pang
H.J. Gao
Affiliation:
Department of Radio Electronics, Peking University, Beijing 100871, People's Republic of China
Z.Q. Xue
Affiliation:
Department of Radio Electronics, Peking University, Beijing 100871, People's Republic of China
Q.D. Wu
Affiliation:
Department of Radio Electronics, Peking University, Beijing 100871, People's Republic of China
S. Pang
Affiliation:
Beijing Laboratory of Vacuum Physics, Academia Sinica, Beijing 100080, People's Republic of China
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Abstract

We report the observation of fractal patterns in C60-tetracyanoquinodimethane thin films. The fractal patterns and their microscopic features are described and characterized. The fractal dimension was determined to be 1.69 ± 0.07. According to the characterization results, the observed fractals are compared to the cluster-diffusion-limited-aggregation model. The growth of the fractal patterns in the thin films is also in terms of the existing long-range correlation.

Type
Rapid Communications
Information
Journal of Materials Research , Volume 9 , Issue 9 , September 1994 , pp. 2216 - 2218
Copyright
Copyright © Materials Research Society 1994

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