Hostname: page-component-cd9895bd7-8ctnn Total loading time: 0 Render date: 2024-12-23T15:49:44.305Z Has data issue: false hasContentIssue false

Nano-sclerometry measurements of superhard materials and diamond hardness using scanning force microscope with the ultrahard fullerite C60 tip

Published online by Cambridge University Press:  31 January 2011

V. Blank
Affiliation:
Research Center for Superhard Materials, Troitsk, Moscow reg., 142092, Russia and Institute of Spectroscopy of the Russian Academy of Sciences, Troitsk, Moscow reg., 142092, Russia
M. Popov
Affiliation:
Research Center for Superhard Materials, Troitsk, Moscow reg., 142092, Russia and Institute of Spectroscopy of the Russian Academy of Sciences, Troitsk, Moscow reg., 142092, Russia
N. Lvova
Affiliation:
Institute of Spectroscopy of the Russian Academy of Sciences, Troitsk, Moscow reg., 142092, Russia
K. Gogolinsky
Affiliation:
High Technology Electronics, Zelenograd, Moscow K-681, P.O. Box 6, 103681, Russia
V. Reshetov
Affiliation:
Moscow Physical Engineering Institute, Moscow, 115409, Russia
Get access

Abstract

The new procedure for the hardness measurements of superhard materials including diamond using the scanning force microscope with the ultrahard fullerite C60 tip was developed. It is shown that diamond is plastically deformed under the indentation by the ultrahard fullerite indenter at room temperature. Now the correct measurements of diamond hardness have become possible. The hardness values measured are 137 ± 6 and 167 ± 5 GPa for the diamond faces (100) and (111), respectively.

Type
Articles
Copyright
Copyright © Materials Research Society 1997

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1.Mayo, M. J., Siegel, R. W., Narayanasamy, A., and Nix, W. D., J. Mater. Res. 5, 1073 (1990).CrossRefGoogle Scholar
2.Pethica, J. B., Hutchings, R., and Oliver, W. C., Philos. Mag. A 48, 593 (1983).CrossRefGoogle Scholar
3.Ma, Q. and Clarke, D. R., J. Mater. Res. 10, 853 (1995).CrossRefGoogle Scholar
4.Doerner, M. F. and Nix, W. D., J. Mater. Res. 1, 601 (1986).CrossRefGoogle Scholar
5.Scholl, D., Everson, M. P., and Jaklevic, R. C., J. Mater. Res. 10, 2503 (1995).CrossRefGoogle Scholar
6.Lilleodden, E. T., Bonin, W., Nelson, J., Wyrobek, J. T., and Gerberich, W. W., J. Mater. Res. 10, 2162 (1995).CrossRefGoogle Scholar
7.Bhushan, B. and Koinkar, V. N., Appl. Phys. Lett. 64, 1653 (1994).CrossRefGoogle Scholar
8.Wilks, J. and Wilks, E., Properties and Applications of Diamond (Butterworth–Heinemann Ltd., Oxford, 1991).Google Scholar
9.Blank, V., Buga, S., Serebryanaya, N., Denisov, V., Dubitsky, G., Ivlev, A., Mavrin, B., and Popov, M., Phys. Lett. A 205, 208 (1995).CrossRefGoogle Scholar
10.Blank, V., Buga, S., Serebryanaya, N., Dubitsky, G., Sulyanov, S., Popov, M., Denisov, V., Ivlev, A., and Mavrin, B., Phys. Lett. A 220, 149 (1996).CrossRefGoogle Scholar
11.Ruoff, R. S. and Ruoff, A. L., Nature 350, 663 (1991).CrossRefGoogle Scholar
12.Howland, R. and Benatar, L., A Practical Guide to Scanning Probe Microscopy (Park Scientific Instruments, Mountain View, CA, 1993).Google Scholar
13.Burnham, N. A., Colton, R. J., and Pollock, H. M., Nanotechnology 4, 64 (1993).CrossRefGoogle Scholar
14.Tansock, J. and Williams, C. C., Ultramicroscopy 42–44, 1464 (1992).CrossRefGoogle Scholar
15.Gogolinsky, K. V., Reshetov, V. N., and Markov, P. I., Proc. Int. Conf. Computer Methods and Inverse Problems in Non-Destructive Testing and Diagnostics (Minsk, Belarus, 1995), pp. 267270.Google Scholar
16.Lyssenko, V., Astashenkov, A., Gogolinsky, K., and Reshetov, V., Proc. 7th Int. Conf. Metrology and Properties of Engineering Surfaces (Göteborg, Sweden, 1997) (in press).Google Scholar
17.Mencik, J. and Swain, M. V., J. Mater. Res. 10, 1491 (1995).CrossRefGoogle Scholar
18.Grigorovich, V. K., Hardness and Microhardness of Metals (Nauka, Moscow, 1976, in Russian).Google Scholar
19.Nonikov, N. V., Dub, S. N., and Mal'nev, V. I., Superhard Materials (in Russian), 1992, No. 5, p. 5.Google Scholar