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Morphology, kinetics, and thermodynamics of solid-state aging of eutectic SnPb and Pb-free solders (Sn–3.5Ag, Sn–3.8Ag–0.7Cu and Sn–0.7Cu) on Cu

Published online by Cambridge University Press:  31 January 2011

T. Y. Lee ,
W. J. Choi ,
K. N. Tu ,
J. W. Jang ,
S. M. Kuo ,
J. K. Lin ,
D. R. Frear ,
K. Zeng  and
J. K. Kivilahti
T. Y. Lee
Affiliation:
Department of Materials Science & Engineering, UCLA, Los Angeles, California 90095–1595
W. J. Choi
Affiliation:
Department of Materials Science & Engineering, UCLA, Los Angeles, California 90095–1595
K. N. Tu
Affiliation:
Department of Materials Science & Engineering, UCLA, Los Angeles, California 90095–1595
J. W. Jang
Affiliation:
Interconnect System Laboratory, Motorola, Tempe, Arizona 85284
S. M. Kuo
Affiliation:
Interconnect System Laboratory, Motorola, Tempe, Arizona 85284
J. K. Lin
Affiliation:
Interconnect System Laboratory, Motorola, Tempe, Arizona 85284
D. R. Frear
Affiliation:
Interconnect System Laboratory, Motorola, Tempe, Arizona 85284
K. Zeng
Affiliation:
Laboratory of Electronics Production Technology, Helsinki University of Technology, FIN-02015, TKK, Finland
J. K. Kivilahti
Affiliation:
Laboratory of Electronics Production Technology, Helsinki University of Technology, FIN-02015, TKK, Finland
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Abstract

Intermetallic compound (IMC) growth during solid-state aging at 125, 150, and 170 °C up to 1500 h for four solder alloys (eutectic SnPb, Sn–3.5Ag, Sn–3.8Ag–0.7Cu, and Sn–0.7Cu) on Cu under bump metallization was investigated. The samples were reflowed before aging. During the reflow, the solders were in the molten state and the formation of the IMC Cu6Sn5 in the cases of eutectic SnPb and Sn–3.5Ag had a round scallop-type morphology, but in Sn–0.7Cu and Sn–3.8Ag–0.7Cu the scallops of Cu6Sn5 were faceted. In solid-state aging, all these scallops changed to a layered-type morphology. In addition to the layered Cu6Sn5, the IMC Cu3Sn also grew as a layer and was as thick as the Cu6Sn5. The activation energy of intermetallic growth in solid-state aging is 0.94 eV for eutectic SnPb and about 1.05 eV for the Pb-free solders. The rate of intermetallic growth in solid-state aging is about 4 orders of magnitude slower than that during reflow. Ternary phase diagrams of Sn–Pb–Cu and Sn–Ag–Cu are used to discuss the reactions. These diagrams predict the first phase of IMC formation in the wetting reaction and the other phases formed in solid-state aging. Yet, the morphological change and the large difference in growth rates between the wetting reaction and solid-state aging cannot be predicted.

Type
Articles
Information
Journal of Materials Research , Volume 17 , Issue 2 , February 2002 , pp. 291 - 301
Copyright
Copyright © Materials Research Society 2002

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References

REFERENCES

1.Glazer, J., Int. Mater. Rev. 40, 65 (1995).CrossRefGoogle Scholar
2.Abtew, M. and Selvaduray, G., Mater. Sci. Eng. 27, 95 (2000).CrossRefGoogle Scholar
3.Bath, J., Handwerker, C., and Bradley, E., Circuits Assem. 11, 30 (2000).Google Scholar
4.Biocca, P., Surf. Mount Technol. 13, 64 (1999).Google Scholar
5.Snowdon, K., Proc. Eur. Microelectron. Packag. Conf., 12th 71 (1999).Google Scholar
6.Kang, S.K. and Sarkhel, A.K., J. Electron. Mater. 23, 701 (1994).CrossRefGoogle Scholar
7.McCormack, M. and Jin, S., J. Electron. Mater. 23, 715 (1994).Google Scholar
8.Morris, J.W., J.Goldstein, L.F., and Mei, Z., JOM 45, 25 (1993).CrossRefGoogle Scholar
9.Sigelko, J., Choi, S., Subramanian, K.N., Lucas, J.P., and Bieler, T.R., J. Electron. Mater. 28, 1184 (1999).CrossRefGoogle Scholar
10.Kang, S.K., Rai, R.S., and Purushothaman, S., J. Electron. Mater. 25, 1113 (1996).Google Scholar
11.Liu, C.Y., C. Chen, Mai, A.K., and Tu, K.N., J. Appl. Phys. 85, 1 (1999).Google Scholar
12.Frear, D.R. and Vianco, P.T., Metall. Mater. Trans. A 25A, 1509 (1994).CrossRefGoogle Scholar
13.Chan, C.F., Lahiri, S.K., Yuan, P., and How, J.B.H., Proc. 2000 Electron. Packag. Technol. Conf. 72 (2000).Google Scholar
14.Lin, J.K., Silva, A. De., Frear, D., Guo, Y., Jang, J.W., Li, L., Mitchell, D., Yeung, B., and Zhang, C., Proc. Electron. Compon. Technol. Conf., 51st 455 (2001).Google Scholar
15.Frear, D., Jang, J.W., Lin, J.K., and Zhang, C., JOM 53, 28 (2001).CrossRefGoogle Scholar
16.Tu, K.N., Lee, T.Y., Jang, J.W., Li, L., Frear, D.R., Zeng, K., and Kivilahti, J., J. Appl. Phys. 89, 4843 (2001).CrossRefGoogle Scholar
17.Frear, D., Grivas, D., and Morris, J.W. Jr., J. Electron. Mater. 16, 181 (1987).CrossRefGoogle Scholar
18.Frederikse, H.P.R., Fields, R.J., and Feldman, A., J. Appl. Phys. 72, 2879 (1992).Google Scholar
19.Oh, C-S., Shim, J-H., Lee, B-J., and Lee, D.N., J. Alloys Comp. 238, 155 (1996).CrossRefGoogle Scholar
20.Shim, J-H., Oh, C-S., Lee, B-J., and Lee, D.N., Z. Metallkd. 87, 205 (1996).Google Scholar
21.Hayes, F.H., Lukas, H.L., Effenberg, G., and Petzow, G., Z. Metallkd. 77, 749 (1986).Google Scholar
22.Kaufinan, L. and Bernstein, H., Computer Calculation of Phase Diagrams (Academic Press, New York, 1970).Google Scholar
23.Peng, W., Zeng, K., and Kivilahti, J.K., Helsinki University of Technology, Helsinki, Finland (unpublished work, 1999).Google Scholar
24.Miller, C.M., Anderson, I.E., and Smith, J.F., J. Electron. Mater. 23, 95 (1994).Google Scholar
25.Loomans, M.E. and Fine, M.E., Metall. Mater. Trans. 31A, 1155 (2000).CrossRefGoogle Scholar
26.Moon, K-W., Boettinger, W.J., Kattner, U.R., Biancaniello, F.S., and Handwerker, C.A., J. Electron. Mater. 29, 1122 (2000).Google Scholar
27.Dyson, B.E., Anthony, T.R., and Turnbull, D., J. Appl. Phys. 38, 3408 (1967).Google Scholar
28.Dyson, B.F., J. Appl. Phys. 37, 2375 (1966).Google Scholar
29.Kim, H.K. and Tu, K.N., Phys. Rev. B 53, 16027 (1996).Google Scholar
30.Belova, I.V. and Murch, G.E., J. Phys. Chem Solids 59, 1 (1997).Google Scholar
31.Tu, K.N. and Thompson, R.D., Acta Metall. 30, 947 (1982).Google Scholar
32.Goria, C., Metall. Ital. 148, 358 (1956).Google Scholar