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Microwave dielectric properties of MO–La2O3–TiO2 (M = Ca, Sr, Ba) ceramics

Published online by Cambridge University Press:  31 January 2011

Isuhak Naseemabeevi Jawahar
Affiliation:
Regional Research Laboratory, Council of Scientific and Industrial Research, Trivandrum, 695 019, India
Narayana Iyer Santha
Affiliation:
Regional Research Laboratory, Council of Scientific and Industrial Research, Trivandrum, 695 019, India
Mailadil Thomas Sebastian*
Affiliation:
Regional Research Laboratory, Council of Scientific and Industrial Research, Trivandrum, 695 019, India
Pezholil Mohanan
Affiliation:
Department of Electronics, Cochin University of Science and Technology, Cochin 682 022, India
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Abstract

Single-phase polycrystalline ceramics in the MO–La2O3–TiO2 (M = Ca, Sr, Ba) system, such as cation-deficient hexagonal perovskites CaLa4Ti4O15, SrLa4Ti4O15, BaLa4Ti4O15, and Ca2La4Ti5O18 and the orthorhombic phases CaLa4Ti5O17 and CaLa8Ti9O31, were prepared through the solid-state ceramic route. The phases and structure of the ceramics were analyzed through x-ray diffraction and scanning electron microscopy. The microwave dielectric properties of the ceramics were studied using a network analyzer. The investigated ceramics show high εr in the range 42 to 54, high quality factors with Q ×f in the range 16,222 to 50,215 GHz, and low Tf in the range –25 to +6 ppm / °C. These high dielectric constant materials with high Q × f up to 50,215 GHz are suitable for applications where narrow bandwidth and extremely low insertion loss is necessary, especially at frequencies around 1.9 GHz.

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Articles
Copyright
Copyright © Materials Research Society 2002

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References

1.Wersing, W., Current Opinion in Solid State Mater. Sci. 1, 715 (1996).CrossRefGoogle Scholar
2.Sreemoolanadhan, H., Sebastian, M.T., and Mohanan, P., Mater. Res. Bull. 30, 653 (1995).CrossRefGoogle Scholar
3.Veneis, C., Davies, P.K., Negas, T., and Bell, S., Mater. Res. Bull. 31, 431 (1996).CrossRefGoogle Scholar
4.Kamba, S., Petzelt, J., Buixaderas, E., Haubrich, D., Vanek, P., Kuzel, P., Jawahar, I.N., Sebastian, M.T., and Mohanan, P., J. Appl. Phys. 89, 3900 (2001).CrossRefGoogle Scholar
5.Ratheesh, R., Sreemoolanadhan, H., and Sebastian, M.T., J. Solid. State. Chem. 2, 131 (1997).Google Scholar
6.Ratheesh, R., Sebastian, M.T., Mohanan, P., Harnett, J., Woode, R.E., and Blair, D.G., Mater. Lett. 45, 279 (2000).CrossRefGoogle Scholar
7.Saltikova, V.A., Melnikova, O.V., Leonova, N.V., and Fedorov, N.F., Russ. J. Inorg. Chem. 30, 105 (1985).Google Scholar
8.Saltikova, V.A., Melnikova, O.V., and Fedodov, N.F., Russ. J. Inorg. Chem. 34, 758 (1989).Google Scholar
9.German, M. and Kovba, L.M., Russ. J. Inorg. Chem. 30, 176 (1985).Google Scholar
10.Harre, N., Mercurio, D., Trolliard, G., and Frit, B., Mater. Res. Bull. 33, 1537 (1998).CrossRefGoogle Scholar
11.Harre, N., Mercurio, D., Trolliard, G., and Frit, B., Eur. J. Solid State Inorg. Chem. 35, 77 (1998).CrossRefGoogle Scholar
12.Teneze, N., Mercurio, D., Trolliard, G., and Frit, B., Mater. Res. Bull. 35, 1603 (2000).CrossRefGoogle Scholar
13.Hakki, B.W. and Coleman, P.D., IRE Trans. Microwave Theory Tech. MTT8, 402 (1960).CrossRefGoogle Scholar
14.Courtney, W.E., IEEE Trans. Microwave Theory Tech. MTT18, 476 (1970).CrossRefGoogle Scholar
15.Krupka, J., Derzakowsky, K., Riddle, B., and Jarviz, J.B., Meas. Sci. Technol. 9, 1751 (1998).CrossRefGoogle Scholar
16.JCPDS Powder Diffraction File Nos. 39–831, 36-1278, 36-1278, 36-1279, 27-1057, 27-1058, 24-1059 (Joint Committee for Powder Diffraction Standards, Newton Square, PA).Google Scholar
17.Roth, R.S., J. Res. Nat. Bur. Stand. 58, 75 (1957).CrossRefGoogle Scholar
18.Brük, E., Route, R.K., Raymakers, R.J., and Feigelson, R.S., J. Cryst. Growth 128, 842 (1993).Google Scholar
19.Penn, S.J., Alford, N.M., Templeton, A., Wang, X., Xu, M., Reece, M., and Schrapel, K., J. Am. Ceram. Soc. 80, 1885 (1997).CrossRefGoogle Scholar
20.Shannon, R.D., J. Appl. Phys. 73, 348 (1993).CrossRefGoogle Scholar
21.Shannon, R.D., Acta Crystall. A 32, 751 (1976).CrossRefGoogle Scholar