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Microwave dielectric properties and vibrational spectroscopic analysis of MgTe2O5 ceramics

Published online by Cambridge University Press:  31 January 2011

G. Subodh ,
R. Ratheesh ,
M.V. Jacob  and
M.T. Sebastian
G. Subodh
Affiliation:
Materials and Minerals Division, National Institute for Interdisciplinary Science and Technology (NIST), Trivandrum-695 019, India
R. Ratheesh
Affiliation:
Microwave Materials Division, Centre for Materials in Electronics (C-MET), Thrissur-680 771, India
M.V. Jacob
Affiliation:
School of Engineering, James Cook University, Townsville, QLD 4811, Australia
M.T. Sebastian*
Affiliation:
Materials and Minerals Division, National Institute for Interdisciplinary Science and Technology (NIST), Trivandrum-695 019, India
*
a)Address all correspondence to this author. e-mail: [email protected]
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Abstract

MgTe2O5 ceramics were prepared by solid-state route. These materials were sintered in the temperature range of 640–720 °C. The structure and microstructure of the compound was investigated using x-ray diffraction (XRD), Fourier transform infrared (FTIR), Raman spectroscopy, and scanning electron microscopy (SEM) techniques. The dielectric properties of the ceramics were studied in the frequency range 4–6 GHz. The MgTe2O5 ceramics have a dielectric constant (ϵr) of 10.5, quality factors (Qu × f) of 61000 at 5.3 GHz, and temperature coefficient of resonant frequency (τf) of −45 ppm/°C at the optimized sintering temperature of 700 °C. The microwave dielectric properties of these materials at cryogenic temperatures were also investigated.

Keywords

Dielectric propertiesRaman spectroscopyCeramic
Type
Articles
Information
Journal of Materials Research , Volume 23 , Issue 6 , June 2008 , pp. 1551 - 1556
Copyright
Copyright © Materials Research Society 2008

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