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Microcharacterization of liquid delivery metalorganic chemical vapor deposition processed thin film materials exhibiting giant magnetoresistance

Published online by Cambridge University Press:  31 January 2011

M. L. Weaver ,
L. P. M. Brandao ,
H. Garmestani ,
E. S. Gillman ,
K. H. Dahmen  and
A. Morrone
M. L. Weaver
Affiliation:
Department of Mechanical Engineering, FAMU-FSU College of Engineering, Tallahassee, Florida 32310–2175
L. P. M. Brandao
Affiliation:
Department of Mechanical Engineering, FAMU-FSU College of Engineering, Tallahassee, Florida 32310–2175
H. Garmestani
Affiliation:
Department of Mechanical Engineering, FAMU-FSU College of Engineering, Tallahassee, Florida 32310–2175
E. S. Gillman
Affiliation:
Department of Chemistry and MARTECH, Florida State University, Tallahassee, Florida 32306–3006
K. H. Dahmen
Affiliation:
Department of Chemistry and MARTECH, Florida State University, Tallahassee, Florida 32306–3006
A. Morrone
Affiliation:
Major Analytical Instrumentation Center, Department of Materials Science and Engineering, University of Florida, Gainesville, Florida 32611–2066
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Abstract

Thin films of La0.6Ca0.4MnO3 (LCMO) have been produced on (001) oriented LaAlO3 (LAO) and yttrium-stabilized zirconia (YSZ) substrates by liquid-delivery metalorganic chemical vapor deposition (LD-MOCVD). X-ray diffraction (XRD) analyses showed that the films were epitaxially grown on LAO substrates and were monocrystalline at a thickness of less than 500 Å. At a thickness of greater than 500 Å, the films became polycrystalline but maintained their high texture (preferred crystalline orientation). Films grown on YSZ were always polycrystalline but were also highly oriented. Regardless of the substrate, the 1500 Å thick polycrystalline films exhibited substantially significant magnetoresistance ratios even above room temperature.

Type
Articles
Information
Journal of Materials Research , Volume 14 , Issue 5 , May 1999 , pp. 2007 - 2011
Copyright
Copyright © Materials Research Society 1999

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References

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