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Measurement of solid state diffusion coefficients by a temperature-programmed method

Published online by Cambridge University Press:  31 January 2011

Rajat Kapoor
Affiliation:
Department of Chemical Engineering, Virginia Polytechnic, Blacksburg, Virginia 24061-0211
S. T. Oyama*
Affiliation:
Department of Chemical Engineering, Virginia Polytechnic, Blacksburg, Virginia 24061-0211
*
a)Author to whom correspondence should be addressed.
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Abstract

This paper presents a method for determining diffusivities in solids where the diffusing species desorbs or reacts at the external surfaces, and where the diffusivity does not vary appreciably with concentration. The method involves measuring the flux of the diffusive species out of the solid under the influence of a temperature program. A general model is developed, based on nonisothermal Fickian diffusion, which is applicable to solid particles with slab or spherical geometry. The solution is presented both as an analytical expression and as correlation charts of experimentally observable quantities. These charts are contour diagrams of the temperatures of peak diffusion rate with ln(E/R) and ln(D0/h2) as the axes, where E and D0 are the activation energy and pre-exponential terms of the diffusivity expression D = D0 exp(−E/RT), where R is the gas constant, and h the size of the particles. This paper deals exclusively with the case of oxygen diffusion in the vanadium oxide system. In this case, vanadium oxide was reduced in a reactive ammonia stream at conditions in which the surface reaction was fast compared to the diffusive transport process. Using this method the diffusion parameters were found to be D0 = 1.9 × 10−5 cm2 s−1 and E = 101 kJ/mol. The method was checked by varying the crystallite size of the vanadium oxide sample in the range 2h = 0.14−0.29 μm.

Type
Articles
Copyright
Copyright © Materials Research Society 1997

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References

REFERENCES

1.Rothman, S. J., Diffusion in Materials, edited by Laskar, A. L.et al. (Kluwer Academic, Dordrecht, 1990), p. 269.Google Scholar
2.Dubinin, M. M., Carbon 13, 193 (1975).Google Scholar
3.Heink, W., Kärger, J., and Pfeifer, H., Chem. Eng. Sci. 33, 1019 (1978).Google Scholar
4. Proc. International Zeolite Conf., edited by Begin, N. G. vandenet al. (Elsevier, Amsterdam, 1989), p. 915.Google Scholar
5.Kärger, J. and Ruthven, D. M., Diffusion in Zeolites and Other Microporous Solids (John Wiley, New York, 1992).Google Scholar
6.Haynes, H. W., Catal. Rev. Sci. Eng. 30, 563 (1988).Google Scholar
7.Cvetanovic, R. J. and Amenomiya, Y., Adv. Catal. 17, 103 (1967).Google Scholar
8.Chan, Y-C. and Anderson, R. B., J. Catal. 50, 319 (1977).CrossRefGoogle Scholar
9.Fraenkel, D., J. Chem. Soc., Faraday Trans. I 77, 2029 (1981).CrossRefGoogle Scholar
10.Fraenkel, D. and Levy, A., J. Chem. Soc., Faraday Trans. I 84, 1817 (1988).CrossRefGoogle Scholar
11.Bard, A. J. and Faulkner, L. R., Electrochemical Methods: Fundamentals and Applications (John Wiley, New York, 1980).Google Scholar
12.Dragoo, A. L., J. Res. Natl. Bureau of Standards A., Phys. Chem. 72A, 157 (1968).Google Scholar
13.Kapoor, R. and Oyama, S. T., J. Solid State Chem. 99, 303 (1992).CrossRefGoogle Scholar
14.Oyama, S. T., J. Catal. 133, 358 (1992).Google Scholar
15.Oyama, S. T., Schlatter, J. C., Metcalfe, J. E., and Lambert, J. M., Jr., Ind. Eng. Chem. Res. 27, 1639 (1988).Google Scholar
16.Kapoor, R. and Oyama, S. T., J. Mater. Res. 12, 474479 (1997).CrossRefGoogle Scholar
17.Redhead, P. A., Vacuum 12, 203 (1962).CrossRefGoogle Scholar
18.Hurst, N. W., Gentry, S. J., Jones, A., and McNicol, B. D., Catal. Rev. Sci. Eng. 24, 233 (1982); S. Bhatia, J. Beltramini, and D. D. Do, Catal. Today 7, 309 (1990).Google Scholar
19.Seltzer, M. S., Oxide and Oxide Films, edited by Diggle, J. W. and Vijh, A. K. (Marcel Dekker, New York, 1972), Vol. 4, p. 1.Google Scholar