Hostname: page-component-586b7cd67f-t7czq Total loading time: 0 Render date: 2024-11-26T16:39:42.686Z Has data issue: false hasContentIssue false

Interfacial reactions and mechanical properties of In–48Sn solder joint with electroplated Au/Ni ball grid array (BGA) substrate after multiple reflows

Published online by Cambridge University Press:  31 January 2011

Ja-Myeong Koo
Affiliation:
School of Advanced Materials Science & Engineering, Sungkyunkwan University, Suwon, Gyeonggi-do 440-746, Korea
Jeong-Won Yoon
Affiliation:
School of Advanced Materials Science & Engineering, Sungkyunkwan University, Suwon, Gyeonggi-do 440-746, Korea
Seung-Boo Jung*
Affiliation:
School of Advanced Materials Science & Engineering, Sungkyunkwan University, Suwon, Gyeonggi-do 440-746, Korea
*
a)Address all correspondence to this author. e-mail: [email protected]
Get access

Abstract

The interfacial reactions and ball shear properties of an In–48wt%Sn solder joint with an electroplated Au/Ni ball grid array substrate were investigated with increasing numbers of reflows using scanning electron microscopy, transmission electron microscopy, energy dispersive x-ray spectrometry, inductively coupled plasma-atomic emission spectroscopy, x-ray diffractometry, and bonding testing. After one reflow, two different intermetallic compound (IMC) layers, AuIn and AuIn2, were formed at the solder–substrate interface. The AuIn was completely transformed into the AuIn2 after three reflows. The AuIn2 IMC layer broke off, and a thin continuous Ni3(SnxIn1–x)4 IMC layer was formed between the molten solder and the exposed Ni substrate after four reflows. After 10 reflows, the AuIn2 IMC layer completely spalled off the substrate and the Ni3(SnxIn1–x)4 IMC layer was dissolved into the molten solder. These interfacial reactions greatly affected the shear properties of the solder joint.

Type
Articles
Copyright
Copyright © Materials Research Society 2008

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1Liu, D.S.Ni, C.Y.: A study on the electrical resistance of solder joint interconnections. Microelectron. Eng. 63, 363 2002CrossRefGoogle Scholar
2Koo, J.M.Jung, S.B.: Effect of displacement rate on ball shear properties for Sn–37Pb and Sn–3.5Ag BGA solder joints during isothermal aging. Microelectron. Reliab. 2007 in pressCrossRefGoogle Scholar
3Tu, K.N.Zeng, K.: Tin–lead (SnPb) solder reaction in flip chip technology. Mater. Sci. Eng., R 34, 1 2001CrossRefGoogle Scholar
4Yoon, J.W., Chun, H.S.Jung, S-B.: Reliability analysis of Au-Sn flip-chip solder bump fabricated by co-electroplating. J. Mater. Res. 22, 1219 2007CrossRefGoogle Scholar
5Wu, A.T.Hua, F.: Interfacial stability of eutectic SnPb solder and composite 60Pb40Sn solder on Cu/Ni(V)/Ti under-bump metallization. J. Mater. Res. 22, 735 2007CrossRefGoogle Scholar
6Lee, N.C.: Reflow Soldering Processes: SMT, BGA, CSP, and Flip Chip Technologies Newnes Boston 2001 239–256Google Scholar
7Shohji, I., Fujiwara, S., Kiyono, S.Kobayashi, K.F.: Intermetallic compound layer formation between Au and In–48Sn solder. Scripta Mater. 40, 815 1999CrossRefGoogle Scholar
8Koo, J.M.Jung, S.B.: Reliability of In–48Sn solder/Au/Ni/Cu BGA packages during reflow process. J. Electron. Mater. 34, 1565 2005CrossRefGoogle Scholar
9Chuang, T.H., Chang, S.Y., Tsao, L.C., Weng, W.P.Wu, H.M.: Intermetallic compounds formed during the reflow of In-49Sn solder ball-grid array packages. J. Electron. Mater. 32, 195 2002CrossRefGoogle Scholar
10Shieu, F.S., Chang, Z.C., Sheen, J.G.Chen, C.F.: Microstructure and shear strength of a Au–In microjoint. Intermetallics 8, 623 2000CrossRefGoogle Scholar
11Huang, C.Y.Chen, S.W.: Interfacial reactions in In-Sn/Ni couples and phase equilibria of the In-Sn-Ni system. J. Electron. Mater. 31, 152 2002CrossRefGoogle Scholar
12Chang, Z.C., Lu, F.H.Shieu, F.S.: Characterization of the microstructure and phase formation in the Au–In system using transmission electron microscopy. Mater. Chem. Phys. 70, 137 2001CrossRefGoogle Scholar
13Ho, C.E., Chen, Y.M.Kao, C.R.: Reaction kinetics of solder-balls with pads in BGA packages during reflow soldering. J. Electron. Mater. 28, 1231 1999CrossRefGoogle Scholar
14Liu, H.S., Cui, Y., Ishida, K.Jin, Z.P.: Thermodynamic reassessment of the Au-In binary system. CALPHAD 27, 27 2003CrossRefGoogle Scholar
15Liu, H.S., Cui, Y., Ishida, K.Jin, Z.P.: Thermodynamic modeling of the Au-In-Sn system. J. Electron. Mater. 32, 1290 2003CrossRefGoogle Scholar
16Shewmon, P.: Diffusion in Solids, 2nd ed.Metals & Materials Society Warrendale, PA 1989 189-222Google Scholar
17Xu, C.Galyon, G.T.Lal, S.Notohardjono, B.: ECTC2005 Tin whisker formation: A stress analysis. iNEMI (http://www.inemi.org).,Google Scholar
18Koo, J.M.Jung, S.B.: Effect of substrate metallization on mechanical properties of Sn-3.5Ag BGA solder joints with multiple reflows. Microelectron. Eng. 82, 569 2005CrossRefGoogle Scholar
19Coyle, R.J., Serafino, A.J.Solan, P.P.: International Electronics Manufacturing Technology Symposium (IEEE & IEE, 2002),200Google Scholar
20Kim, J.W.Jung, S.B.: Characterization of the shear test method with low melting point In–48Sn solder joints. Mater. Sci. Eng., A 397, 145 2005CrossRefGoogle Scholar