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The influence of Pt and SrTiO3 interlayers on the microstructure of PbTiO3 thin films deposited by laser ablation on (001) MgO

Published online by Cambridge University Press:  03 March 2011

S. Stemmer
Affiliation:
Max-Planck-Institut für Metallforschung, Institut für Werkstoffwissenschaft, Seestraβe 92, 70174 Stuttgart, Germany
S.K. Streiffer
Affiliation:
Max-Planck-Institut für Metallforschung, Institut für Werkstoffwissenschaft, Seestraβe 92, 70174 Stuttgart, Germany
W-Y. Hsu
Affiliation:
Department of Materials Science and Engineering, Bard Hall, Cornell University, Ithaca, New York 14853-1510
F. Ernst
Affiliation:
Max-Planck-Institut für Metallforschung, Institut für Werkstoffwissenschaft, Seestraβe 92, 70174 Stuttgart, Germany
R. Raj
Affiliation:
Department of Materials Science and Engineering, Bard Hall, Cornell University, Ithaca, New York 14853-1510
M. Rühle
Affiliation:
Max-Planck-Institut für Metallforschung, Institut für Werkstoffwissenschaft, Seestraβe 92, 70174 Stuttgart, Germany
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Abstract

We have used conventional and high-resolution transmission electron microscopy to investigate the microstruture of epitaxial, ferroelectric PbTiO3 films grown by pulsed laser ablation on (001) MgO single crystals, and on MgO covered with epitaxial Pt or SrTiO3. Pronounced variations are found in the widths and lengths of a-axis-oriented domains in these films, although the volume fraction of a-axis-oriented material varies only weakly for the different types of samples. In addition, the films deposited onto Pt-coated MgO have a larger grain size than those deposited onto bare MgO or SrTiO3/MgO. Possible reasons for the variations in the distribution of a-axis-oriented material in these samples include differences in the elastic properties and electrical conductivities of the different substrate combinations.

Type
Communication
Copyright
Copyright © Materials Research Society 1995

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References

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