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Indium-tin oxide thin films by metal-organic decomposition

Published online by Cambridge University Press:  03 March 2011

Dennis Gallagher ,
Francis Scanlan ,
Raymond Houriet ,
Hans Jörg Mathieu  and
Terry A. Ring
Dennis Gallagher
Affiliation:
Laboratoire de Technologie des Poudres, École Polytechnique Fédérale de Lausanne, CH-1015 Lausanne, Switzerland
Francis Scanlan
Affiliation:
Laboratoire de Technologie des Poudres, École Polytechnique Fédérale de Lausanne, CH-1015 Lausanne, Switzerland
Raymond Houriet
Affiliation:
Laboratoire de Technologie des Poudres, École Polytechnique Fédérale de Lausanne, CH-1015 Lausanne, Switzerland
Hans Jörg Mathieu
Affiliation:
Laboratoire de Technologie des Poudres, École Polytechnique Fédérale de Lausanne, CH-1015 Lausanne, Switzerland
Terry A. Ring*
Affiliation:
Laboratoire de Technologie des Poudres, École Polytechnique Fédérale de Lausanne, CH-1015 Lausanne, Switzerland
*
d)Author to whom correspondence should be sent.
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Abstract

In2O3–SnO2 films were produced by thermal decomposition of a deposit which was dip coated on borosilicate glass substrates from an acetylacetone solution of indium and tin acetoacetonate. Thermal analysis showed complete pyrolysis of the organics by 400 °C. The thermal decomposition reaction generated acetylacetone gas and was found to be first order with an activation energy of 13.6 Kcal/mole. Differences in thermal decomposition between the film and bulk materials were noted. As measured by differential scanning calorimetry using a 40 °C/min temperature ramp, the glass transition temperature of the deposited oxide film was found to be ∼462 °C, and the film crystallization temperature was found to be ∼518 °C. For film fabrication, thermal decomposition of the films was performed at 500 °C in air for 1 h followed by reduction for various times at 500 °C in a reducing atmosphere. Crystalline films resulted for these conditions. A resistivity of ∼1.01 × 10−3 Ω · cm, at 8 wt. % tin oxide with a transparency of ∼95% at 400 nm, has been achieved for a 273 nm thick film.

Type
Articles
Information
Journal of Materials Research , Volume 8 , Issue 12 , December 1993 , pp. 3135 - 3144
Copyright
Copyright © Materials Research Society 1993

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