Hostname: page-component-78c5997874-v9fdk Total loading time: 0 Render date: 2024-11-08T08:12:30.348Z Has data issue: false hasContentIssue false

Growth of high-quality Bi2Sr2CaCu2Oz crystal and characterization

Published online by Cambridge University Press:  31 January 2011

H. Faqir
Affiliation:
Laboratoire de Physico-Chimie des Matériaux-Équipe de Chimie du Solide, Université de Provence–Centre St-Charles, 13331 Marseille Cedex 3, France
G. Vacquier
Affiliation:
Laboratoire de Physico-Chimie des Matériaux-Équipe de Chimie du Solide, Université de Provence–Centre St-Charles, 13331 Marseille Cedex 3, France
H. Chiba
Affiliation:
Institute for Materials Research, Tohoku University, Katahira, Sendai 980, Japan
M. Kikuchi
Affiliation:
Institute for Materials Research, Tohoku University, Katahira, Sendai 980, Japan
Y. Muraoka
Affiliation:
Institute for Materials Research, Tohoku University, Katahira, Sendai 980, Japan
Y. Syono
Affiliation:
Institute for Materials Research, Tohoku University, Katahira, Sendai 980, Japan
Get access

Abstract

We report growth of high-quality Bi2Sr2CaCu2Oz single crystals with dimensions 2 × 1 × 0.03 mm3 with a melt and growth technique. The composition of this crystal is homogeneous and very close to the stoichiometric composition. Structure characterization of a single crystal was realized by measuring the (001) x-ray diffraction. The lattice parameters of a typical crystal are a = 5.414(2) Å, b = 5.413(2) Å, and c = 30.823(10) Å. The superconducting temperature Tc = 95 K with a sharp transition width (10–90% level) between 6 and 10 K was determined from resistivity and dc susceptibility. We have measured the magnetization of Bi2Sr2CaCu2Oz single crystal under magnetic field applied along the c-axis. The anomalous second peak effect appeared between 20 and 30 K. We discuss the qualities of these crystals.

Type
Articles
Copyright
Copyright © Materials Research Society 1997

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1.Michel, C., Hervieu, M., Borel, M. M., Grandin, A., Deslandes, F., Provost, J., and Raveau, B., Z. Phys. B 68, 421 (1987).CrossRefGoogle Scholar
2.Maeda, M., Tanaka, Y., Fukukumi, M., and Asano, T., Jpn. J. Appl. Phys. 27, L209 (1988).CrossRefGoogle Scholar
3.Strobel, P., Toledano, J. C., Morin, D., Schneck, J., Vacquier, G., Monnereau, O., Primot, J., and Fournier, T., Physica C 24, 201 (1992).Google Scholar
4.Faqir, H., Monnereau, O., Vacquier, G., and Casalot, A., Ann. Chim. Fr. 19, 517 (1994).Google Scholar
5.Emmen, J. H. P. M., Lenczowski, S. K. J., Dalderop, J. H. J., and Brabers, V. A. M., J. Cryst. Growth 118, 477 (1992).CrossRefGoogle Scholar
6.Han, P. D. and Payne, D. A., J. Cryst. Growth 104, 201 (1990).CrossRefGoogle Scholar
7.Kang, Z. C., Monnereau, O., Remy, F., Spas, S., Casalot, A., Sorbier, J. P., Fournel, A., and Boulesteix, C., J. Phys. Fr. 50, 1227 (1989).CrossRefGoogle Scholar
8.Badeche, T., Monnereau, O., Ghorayeb, A. M., Grachev, V., and Boulesteix, C., Physica C. 24, 10 (1995).CrossRefGoogle Scholar
9.Faqir, H., Monnereau, O., Badeche, T., Vacquier, G., and Casalot, A., J. Phys. Chem. Solids 58, 821 (1997).CrossRefGoogle Scholar
10.Kishio, K., Shimoyama, J., Kotaka, Y., and Yamafuji, K., Proc. 7th Int. Workshop on Critical Currents in Superconductors, edited by Weber, H. W. (World Scientific, Singapore, 1994), Vol. 9, p. 399.Google Scholar
11.Hanaguri, T., Tsuboi, T., Maeda, A., Nishizaki, T., Kobayashi, N., Kotaka, Y., Shimoyama, J., and Kishio, K., Physica C 256, 111 (1996).CrossRefGoogle Scholar
12.Yang, G., Shang, P., Sutton, S. D., Jones, I. P., Abell, J. S., and Gough, C. E., Phys. Rev. B 48, 4054 (1993).CrossRefGoogle Scholar
13.Tamegai, T., Iye, Y., Oguro, I., and Kishio, K., Physica C 213, 33 (1993).CrossRefGoogle Scholar
14.Chowdhury, A. J. S., Wanklyn, B. M. R., Wondre, F. R., Hodby, J. W., Volkozub, A. V., and de Groot, P. A. J., Physica C 225, 388 (1994).CrossRefGoogle Scholar
15.Pham, A. Q., Hervieu, M., Maignan, A., Michel, C., Provost, J., and Raveau, B., Physica C 194, 243 (1992).CrossRefGoogle Scholar
16.Schweizer, Th., Mûller, R., and Gauckler, L. J., Physica C 225, 143 (1994).CrossRefGoogle Scholar