Hostname: page-component-78c5997874-s2hrs Total loading time: 0 Render date: 2024-11-19T08:34:06.110Z Has data issue: false hasContentIssue false
  • English
  • Français

From small angle x-ray scattering to reflectivity: Instrumentation and sample study

Published online by Cambridge University Press:  31 January 2011

D. W. Hua ,
G. Beaucage  and
M. S. Kent
D. W. Hua
Affiliation:
Center for Micro-Engineered Ceramics, University of New Mexico, Albuquerque, New Mexico 87131–6041
G. Beaucage
Affiliation:
Department of Materials Science and Engineering, University of Cincinnati, Cincinnati, Ohio 45221–0012
M. S. Kent
Affiliation:
Sandia National Laboratory, Albuquerque, New Mexico 87185
Get access

Abstract

In this study, we described the first results from an x-ray reflectometer which has been modified from an existing Kratky small angle x-ray scattering (SAXS) camera at the UNM/Sandia scattering center. Typically, seven orders of magnitude of reflectivity can be obtained over a range of 0.02 to 0.5 Å−1 in q. This allows the resolution of surface features of 10 to 1000 Å. The conversion to reflectometer is reversible and can be achieved in a short time, allowing for dual use of an existing Kratky camera.

Type
Articles
Information
Journal of Materials Research , Volume 11 , Issue 2 , February 1996 , pp. 273 - 276
Copyright
Copyright © Materials Research Society 1996

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1.Russell, T. P., Mater. Sci. Rep. 5, 171 (1990).Google Scholar
2.Felcher, G. P., Hilleke, R. O., Crawford, R. K., Haumann, J., Kleb, R., and Ostrowski, G., Rev. Sci. Instrum. 58, 609 (1987).Google Scholar
3.Sinha, S.K., Sirota, E.B., Garoff, S., and Stanley, H.B., Phys. Rev. B 38, 2297 (1988).Google Scholar
4.Penfold, J. and Thomas, R. K., Phys, J..: Condens. Matter 2, 1369 (1990).Google Scholar
5.Weber, W. and Lengeler, B., Phys. Rev. B 46, 7953 (1992).Google Scholar
6. Unpublished data, U of A data from J. A. Ruffner, with reflectometer (triple axis goniometer for θ/2θ scan) in C.M. Falco's group.Google Scholar