Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by
Crossref.
Kholkin, A. L.
Wütchrich, Ch.
Taylor, D. V.
and
Setter, N.
1996.
Interferometric measurements of electric field-induced displacements in piezoelectric thin films.
Review of Scientific Instruments,
Vol. 67,
Issue. 5,
p.
1935.
Wang, C.L.
and
Smith, S.R.P.
1996.
Landau theory of asymmetric behaviour in ferroelectric thin films.
Solid State Communications,
Vol. 99,
Issue. 8,
p.
559.
Kholkin, A. L.
Calzada, M. L.
Ramos, P.
Mendiola, J.
and
Setter, N.
1996.
Piezoelectric properties of Ca-modified PbTiO3 thin films.
Applied Physics Letters,
Vol. 69,
Issue. 23,
p.
3602.
Burtman, Vladimir
Yitzchaik, Shlomo
Aleksiuk, Oleg
Meshulam, Guilia
Berkovic, Garry
and
Kotler, Zvi
1997.
A New Calix[4]arene-Based Barium Precursor for BaO−TiO2 Thin Film Deposition.
Chemistry of Materials,
Vol. 9,
Issue. 12,
p.
3101.
Kholkin, A. L.
Brooks, K. G.
and
Setter, N.
1997.
Electromechanical properties of SrBi2Ta2O9 thin films.
Applied Physics Letters,
Vol. 71,
Issue. 14,
p.
2044.
Lee, Chengkuo
Itoh, Toshihiro
Ohashi, Takahiro
Maeda, Ryutaro
and
Suga, Tadatomo
1997.
Development of a piezoelectric self-excitation and self-detection mechanism in PZT microcantilevers for dynamic scanning force microscopy in liquid.
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,
Vol. 15,
Issue. 4,
p.
1559.
Steinhausen, R.
Hauke, T.
Seifert, W.
Mueller, V.
Beige, H.
Seifert, S.
and
Lobmann, P.
1998.
Clamping of piezoelectric thin films on metallic substrates: influence on the effective piezoelectric modulus d/sub 33/.
p.
93.
Cattan, E.
Jaber, B.
Tronc, P.
Remiens, D.
and
Thierry, B.
1998.
Piezoelectric properties of sputtered PbTiO3 films: Growth temperature and poling treatment effects.
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films,
Vol. 16,
Issue. 1,
p.
169.
Wang, C.L.
Zhang, L.
Peng, Y.P.
Zhong, W.L.
Zhang, P.L.
and
Wang, Y.X.
1998.
Landau theory of asymmetric ferroelectric films under external electric fields.
Solid State Communications,
Vol. 109,
Issue. 3,
p.
213.
Kholkin, A.
Tantigate, C.
and
Safari, A.
1998.
Electromechanical properties of PMN-PT thin films prepared by pulsed laser deposition technique.
Integrated Ferroelectrics,
Vol. 22,
Issue. 1-4,
p.
515.
Damjanovic, Dragan
1998.
Ferroelectric, dielectric and piezoelectric properties of ferroelectric thin films and ceramics.
Reports on Progress in Physics,
Vol. 61,
Issue. 9,
p.
1267.
Hu, G. D.
Xu, J. B.
and
Wilson, I. H.
1999.
Domain imaging and local piezoelectric properties of the (200)-predominant SrBi2Ta2O9 thin film.
Applied Physics Letters,
Vol. 75,
Issue. 11,
p.
1610.
Lee, Chengkuo
Itoh, Toshihiro
and
Suga, Tadatomo
1999.
Self-excited piezoelectric PZT microcantilevers for dynamic SFM—with inherent sensing and actuating capabilities.
Sensors and Actuators A: Physical,
Vol. 72,
Issue. 2,
p.
179.
Wang, C. L.
Zhang, L.
Zhong, W. L.
and
Zhang, P. L.
1999.
Landau theory of ferroelectric films with asymmetric behavior.
Ferroelectrics,
Vol. 229,
Issue. 1,
p.
27.
Wang, C.L.
Zhang, L.
Zhong, W.L.
and
Zhang, P.L.
1999.
Switching characters of asymmetric ferroelectric films.
Physics Letters A,
Vol. 254,
Issue. 5,
p.
297.
Rastogi, A.C.
Darvish, S.R.
and
Bhatnagar, P.K.
2002.
Phase evolution of electron-beam evaporated Pb(Zr,Ti)O3 thin films.
Materials Chemistry and Physics,
Vol. 73,
Issue. 2-3,
p.
135.
Wang, Xin
Olafsson, Sveinn
Madsen, Lynnette D.
Rudner, Staffan
Ivanov, Ivan P.
Grishin, Alex
and
Helmersson, Ulf
2002.
Growth and Characterization of Na0.5K0.5NbO3 Thin Films on Polycrystalline Pt80Ir20 Substrates.
Journal of Materials Research,
Vol. 17,
Issue. 5,
p.
1183.
Dogheche, E.
Remiens, D.
and
Velu, G.
2002.
Electrical and optical characterizations by prism-coupling method of PZT deposited in-situ by sputtering.
Vacuum,
Vol. 66,
Issue. 1,
p.
1.
Xu, C.H.
Woo, C.H.
Shi, S.Q.
and
Wang, Y.
2004.
Effects of frequencies of AC modulation voltage on piezoelectric-induced images using atomic force microscopy.
Materials Characterization,
Vol. 52,
Issue. 4-5,
p.
319.
Lian, L.
and
Sottos, N. R.
2004.
Stress effects in sol-gel derived ferroelectric thin films.
Journal of Applied Physics,
Vol. 95,
Issue. 2,
p.
629.