Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by
Crossref.
Juan, Yu-Min
and
Kaxiras, Efthimios
1993.
High-pressure plastic flow in silicon: A first-principles theoretical study.
Journal of Computer-Aided Materials Design,
Vol. 1,
Issue. 1,
p.
55.
Morris, Jonathan C.
1993.
Imaging microstructural contact damage in silicon.
Proceedings, annual meeting, Electron Microscopy Society of America,
Vol. 51,
Issue. ,
p.
1144.
Brotzen, F. R.
1994.
Mechanical testing of thin films.
International Materials Reviews,
Vol. 39,
Issue. 1,
p.
24.
Brotzen, F. R.
1994.
Mechanical testing of thin films.
International Materials Reviews,
Vol. 39,
Issue. 1,
p.
24.
Bhushan, Bharat
and
Koinkar, Vilas N.
1994.
Nanoindentation hardness measurements using atomic force microscopy.
Applied Physics Letters,
Vol. 64,
Issue. 13,
p.
1653.
Morris, J.C.
and
Callahan, D.L.
1994.
Origins of microplasticity in low-load scratching of silicon.
Journal of Materials Research,
Vol. 9,
Issue. 11,
p.
2907.
Yoshioka, M.
1994.
Plastically deformed region around indentations on Si single crystal.
Journal of Applied Physics,
Vol. 76,
Issue. 12,
p.
7790.
Morris, Jonathan C.
Callahan, Daniel L.
Kulik, Joseph
Patten, John A.
and
Scattergood, Ronald O.
1995.
Origins of the Ductile Regime in Single‐Point Diamond Turning of Semiconductors.
Journal of the American Ceramic Society,
Vol. 78,
Issue. 8,
p.
2015.
Hainsworth, Sarah V.
Whitehead, Andrew J.
and
Page, Trevor F.
1995.
Plastic Deformation of Ceramics.
p.
173.
Suzuki, Takayoshi
and
Ohmura, Takahito
1996.
Ultra-microindentation of silicon at elevated temperatures.
Philosophical Magazine A,
Vol. 74,
Issue. 5,
p.
1073.
Busch, E.
and
Haneman, D.
1996.
On the electromechanical effect in Si and Ge.
Tribology Letters,
Vol. 2,
Issue. 2,
p.
199.
Bhushan, Bharat
1996.
Tribology and Mechanics of Magnetic Storage Devices.
p.
864.
Randall, N.X.
Christoph, R.
Droz, S.
and
Julia-Schmutz, C.
1996.
Localised micro-hardness measurements with a combined scanning force microscope/nanoindentation system.
Thin Solid Films,
Vol. 290-291,
Issue. ,
p.
348.
Callahan, Daniel L.
1997.
Microanalysis of plastic strain.
Ultramicroscopy,
Vol. 69,
Issue. 1,
p.
13.
Koinkar, Vilas N.
and
Bhushan, Bharat
1997.
Scanning and transmission electron microscopies of single-crystal silicon microworn/machined using atomic force microscopy.
Journal of Materials Research,
Vol. 12,
Issue. 12,
p.
3219.
Galanov, B. A.
Grigor'ev, O. N.
and
Gogotsi, Y. G.
1997.
Effect of Phase Transformations on Hardness of Semiconductors.
MRS Proceedings,
Vol. 481,
Issue. ,
Gogotsi, Yury
Rosenberg, Michael S.
Kailer, Andreas
and
Nickel, Klaus G.
1998.
Tribology Issues and Opportunities in MEMS.
p.
431.
Bhushan, Bharat
1998.
Handbook of Micro/Nano Tribology, Second Edition.
Wall, M. A.
and
Dahmen, U.
1998.
An in situ nanoindentation specimen holder for a high voltage transmission electron microscope.
Microscopy Research and Technique,
Vol. 42,
Issue. 4,
p.
248.
Shimatani, A.
Nango, T.
Suprijadi
and
Saka, H.
1998.
FLB/TEM Observation of Defect Structure Underneath an Indentation in Silicon.
MRS Proceedings,
Vol. 522,
Issue. ,