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Electron microscopy characterization of Ba(Cd1/3Ta2/3)O3 microwave dielectrics with boron additive

Published online by Cambridge University Press:  03 March 2011

J. Sun ,
Shaojun Liu ,
N. Newman ,
M.R. McCartney  and
David. J. Smith
J. Sun
Affiliation:
Center for Solid State Science, Arizona State University, Tempe, Arizona 85287; and School of Materials Science and Engineering, Shanghai Jiao-tong University, Shanghai 20003, People’s Republic of China
Shaojun Liu
Affiliation:
Department of Chemical and Materials Engineering, Science and Engineering Materials Program, Arizona State University, Tempe, Arizona 85287
N. Newman
Affiliation:
Department of Chemical and Materials Engineering, Science and Engineering Materials Program, Arizona State University, Tempe, Arizona 85287
M.R. McCartney
Affiliation:
Center for Solid State Science, Arizona State University, Tempe, Arizona 85287
David. J. Smith
Affiliation:
Center for Solid State Science, and Department of Physics and Astronomy, Arizona State University, Tempe, Arizona 85287
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Abstract

The microstructure of Ba(Cd1/3Ta2/3)O3 ceramics with boron additive was investigated by high-resolution and analytical electron microscopy. Superlattice reflections were present at positions of (h ± 1/3, k ± 1/3, l ± 1/3) away from the fundamental reflections in the [110] zone diffraction pattern for the pseudocubic perovskite unit cell. Lattice images showed a well-ordered structure with hexagonal symmetry. No boron segregation and amorphous phase was observed along grain boundaries. An amorphous phase rich in boron-oxide was observed to form pockets partially penetrating along multiple grain junctions.

Keywords

CeramicMicrostructureTransmission electron microscopy (TEM)
Type
Articles
Information
Journal of Materials Research , Volume 19 , Issue 5 , May 2004 , pp. 1387 - 1391
Copyright
Copyright © Materials Research Society 2004

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