Hostname: page-component-cd9895bd7-fscjk Total loading time: 0 Render date: 2024-12-23T12:22:09.052Z Has data issue: false hasContentIssue false
  • English
  • Français

Electron channeling effect on highly oriented graphites–Size evaluation and oriented mapping of crystals

Published online by Cambridge University Press:  31 January 2011

Akira Yoshida  and
Yoshihiro Hishiyama
Akira Yoshida
Affiliation:
Musashi Institute of Technology, 1-28-1, Tamazutsumi, Setagaya-ku, Tokyo 158, Japan
Yoshihiro Hishiyama
Affiliation:
Musashi Institute of Technology, 1-28-1, Tamazutsumi, Setagaya-ku, Tokyo 158, Japan
Get access

Abstract

Structural studies on kish graphite (KG) and highly oriented pyrolytic graphite (HOPG) were performed using the techniques of electron channeling pattern (ECP) and electron channeling micrograph (ECM) in the scanning electron microscope. In the KG specimens the ECP for the single crystal was observed for each specimen, while in the HOPG specimens those of polycrystalline graphites with parallel c-axes were observed. The crystal sizes along the a-axis in the HOPG specimens were evaluated by ECM's. The average crystal size was related to a parameter sensitive to their crystallinity, i.e., the ratio of the resistivity at room temperature to that at 4.2 K (residual resistivity ratio). A mapping of the a-axis orientation of HOPG specimens was carried out.

Type
Articles
Information
Journal of Materials Research , Volume 7 , Issue 6 , June 1992 , pp. 1400 - 1405
Copyright
Copyright © Materials Research Society 1992

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1.Yoshida, A. and Hishiyama, Y., TANSO (No. 130), 110 (1987).CrossRefGoogle Scholar
2.Booker, G. R., Shaw, A. M. B., Whelan, M. J., and Hirsch, P. B., Philos. Mag. 16, 1185 (1967).CrossRefGoogle Scholar
3.Booker, G. R. (Scanning Electron Microscope Symp. Proc, Chicago, IL, 1970), p. 489.Google Scholar
4.Joy, D. C., Newbury, D. E., and Davidson, D. L., J. Appl. Phys. 53, R 81 (1982)CrossRefGoogle Scholar
5.Hishiyama, Y. and Ono, A., Carbon 23, 445 (1985).CrossRefGoogle Scholar
6.Williamson, S. J., Foner, S., and Dresselhaus, M. S., Phys. Rev. 140, A1429 (1965).CrossRefGoogle Scholar