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Effect of geometrical parameters on the field-emission properties of single-walled carbon nanotube ropes

Published online by Cambridge University Press:  31 January 2011

Z. G. Zhao ,
Y. Tong ,
C. Liu  and
H. M. Cheng
Z. G. Zhao
Affiliation:
Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, 72 Wenhua Road, Shenyang 110016, People's Republic of China
Y. Tong
Affiliation:
Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, 72 Wenhua Road, Shenyang 110016, People's Republic of China
C. Liu
Affiliation:
Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, 72 Wenhua Road, Shenyang 110016, People's Republic of China
H. M. Cheng*
Affiliation:
Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, 72 Wenhua Road, Shenyang 110016, People's Republic of China
*
a) Address all correspondence to this author. e-mail: [email protected]
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Abstract

Aligned single-walled carbon nanotube (SWNT) ropes show excellent field-emission performance due to their high aspect ratio and sound alignment. In this study, the effect of geometrical parameters, such as cathode-anode distance and the height of SWNT ropes on the field-emission properties of SWNT ropes was investigated. It was found that the cathode-anode distance influences the emission properties, such as the turn-on field Fto and threshold field Fthr, of SWNT ropes, and the turn-on and threshold fields are marginally decreased at relatively larger gaps between the SWNT emitter tip and the anode plane. It was also found that the emission properties of SWNT ropes are improved by increasing the rope length, at least in the present experimental range. A possible two-step field amplification model was proposed to explain this length effect of SWNT ropes. The estimated results show that the local field at the tip of SWNT ropes, which causes a certain emission-current density, seems not to change with the cathode-anode distance, and the effective emission area of the SWNT rope is much smaller than the apparent cross-sectional area of the SWNT rope. The results obtained suggest that it is possible to optimize the performance of SWNT rope-based cold cathode by adjusting geometrical parameters of SWNT rope emitters.

Type
Articles
Information
Journal of Materials Research , Volume 18 , Issue 9 , September 2003 , pp. 2188 - 2193
Copyright
Copyright © Materials Research Society 2003

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References

REFERENCES

1.Robertson, J., in Electron-Emissive Materials, Vacuum Microelectronics and Flat-Panel Displays, edited by Jensen, K.L., Mackie, W., Temple, D., Itoh, J., Nemanich, R., Trottier, T., and Holloway, P. (Mater. Res. Soc. Symp. Proc. 621, Warrendale, PA, 2000), p. 234.Google Scholar
2.Wang, Q.H., Setlur, A.A., Lauerhaas, J.M., Dai, J.Y., Han, I.T., Lee, Y.H., Jung, J.E., Park, N.S., and Kim, J.M., Appl. Phys. Lett. 75, 20 (1999).Google Scholar
3.de, W.A. Heer, Châtelain, A., and Ugate, D., Science 270, 1179 (1995).Google Scholar
4.Yue, G.Z., Qiu, Q., Bo, Y. Gao, Cheng, Y., Zhang, J., Shimoda, H., Chang, S., Lu, J.P., and Zhou, O., Appl. Phys. Lett. 81, 355 (2002).CrossRefGoogle Scholar
5.Lei, W., Wang, B.P., Tong, L.S., Yin, H.C., Tu, Y., and Zhu, C.C., J. Vac. Sci. Tehnol. B 18, 2704 (2000).Google Scholar
6.Liu, C., Cheng, H.M., Cong, H.T., Li, F., Su, G., Zhou, B.L., and Dresselhaus, M.S., Adv. Mater. 12, 1190 (2000).3.0.CO;2-C>CrossRefGoogle Scholar
7.Edgcombe, C.J. and Valdre, U., Philos. Mag. B. 82, 987 (2002).Google Scholar
8.Bonard, J.M., Dean, K.A., Coll, B.F., and Klinke, C., Phys. Rev. Lett. 89(19), 197602 (2002).CrossRefGoogle Scholar
9.Monteiro, O.R., Mammana, V.P., Salvadori, M.C., Ager, J.W. III, and Dimitrijevic, S.. Appl. Phys. A 71, 121 (2000).CrossRefGoogle Scholar
10.Bonard, J.M., Maier, F., and Stockli, T., Ultramicroscopy 73, 7 (1998).CrossRefGoogle Scholar
11.Shyu, Y.M. and Hong, F.C., Mater. Chem. Phys. 72, 223 (2001).CrossRefGoogle Scholar