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Distribution of chlorine in quartz determined by neutron beam focusing prompt gamma activation analysis and micro-x-ray fluorescence

Published online by Cambridge University Press:  03 March 2011

H. Heather Chen-Mayer ,
William J. Heward ,
Rick L. Paul ,
Frederic J. Klug  and
Yan Gao
H. Heather Chen-Mayer
Affiliation:
National Institute of Standards and Technology, Gaithersburg, Maryland 20899
William J. Heward
Affiliation:
GE Global Research Center, Niskayuna, New York 12309
Rick L. Paul
Affiliation:
National Institute of Standards and Technology, Gaithersburg, Maryland 20899
Frederic J. Klug
Affiliation:
GE Global Research Center, Niskayuna, New York 12309
Yan Gao
Affiliation:
GE Global Research Center, Niskayuna, New York 12309
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Abstract

This paper describes two spatially resolved analytical techniques for chlorine distribution analysis in high-purity quartz glass. The first, prompt gamma activation analysis (PGAA), to which most of this paper is devoted, is emphasized because a new neutron focusing technique has made this study feasible. Despite the low concentration of chlorine, the neutron absorption cross section for Cl is about 200 times greater than for Si, making Cl in Si an ideal system for PGAA. The second technique described is micro-x-ray fluorescence using a laboratory-based spectrometer. The results from each technique and their ability to quantify low levels of chlorine (400–1800 μg Cl/g SiO2) are described.

Type
Articles
Information
Journal of Materials Research , Volume 18 , Issue 10 , October 2003 , pp. 2486 - 2493
Copyright
Copyright © Materials Research Society 2003

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References

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