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Dielectric Properties of Pb(Fe2/3W1/3)1−xMnxO3 Ceramics in the Temperature Range 200–600 K

Published online by Cambridge University Press:  31 January 2011

Liqin Zhou ,
P. M. Vilarinho ,
P. Q. Mantas  and
J. L. Baptista
Liqin Zhou
Affiliation:
Department of Ceramics and Glass Engineering, UIMC, University of Aveiro, 3810 Aveiro, Portugal
P. M. Vilarinho
Affiliation:
Department of Ceramics and Glass Engineering, UIMC, University of Aveiro, 3810 Aveiro, Portugal
P. Q. Mantas
Affiliation:
Department of Ceramics and Glass Engineering, UIMC, University of Aveiro, 3810 Aveiro, Portugal
J. L. Baptista
Affiliation:
Department of Ceramics and Glass Engineering, UIMC, University of Aveiro, 3810 Aveiro, Portugal
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Abstract

The dielectric properties of Mn-doped Pb(Fe2/3W1/3)1−xMnxO3 (x = 0, 0.001, 0.003, and 0.005) in the temperature range 200–600 K were investigated. Two sets of dielectric peaks, located at 200–350 K and 350–600 K, were observed. The intensity of the dielectric permittivity and loss factor peaks for both relaxations decreased with the increase in the Mn content and no peak occurred when x = 0.005. Nonlinear current–voltage (I–V) behavior was observed in the samples containing less than 0.005Mn. The activation energy values for the relaxations at 200–350 K and at 350–600 K were around 0.42 and 0.56 eV, respectively. The direct current conduction activation energies were around 0.41 eV. Nitrogen annealing eliminated the relaxation peaks at 200–350 K while oxygen annealing enhanced them. Both annealings eliminated the dielectric peaks at 350–600 K. The nonlinear I–V characteristic tended to vanish either after the oxygen or the nitrogen annealing treatments. Relaxation mechanisms are proposed and discussed. It is suggested that the relaxation at 200–350 K is related to electron hole while the relaxation at 350–600 K is attributed to microstructure-dependent space-charge polarization.

Type
Articles
Information
Journal of Materials Research , Volume 15 , Issue 6 , June 2000 , pp. 1342 - 1348
Copyright
Copyright © Materials Research Society 2000

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References

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